Харвестер відкритої науки НАН України

Influence of elastic deformation on the residual ellipticity of polished optical materials

за авторством Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Ellipsometric control of quality of polished MgF₂ optical ceramics

за авторством Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials”

за авторством Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry

за авторством Odarych, V.A., Sarsembaeva, A.Z., Vuichyk, M.V., Sizov, F.F.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2006)

Investigation of cadmium telluride films on silicon substrate

за авторством Odarych, V.A., Sarsembaeva, A.Z., Sizov, F.F., Vuichyk, M.V.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2005)