Influence of elastic deformation on the residual ellipticity of polished optical materials

за авторством Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Опубліковано 2003

Ellipsometric control of quality of polished MgF₂ optical ceramics

за авторством Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Опубліковано 2004

Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials”

за авторством Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Опубліковано 2004

Investigation of cadmium telluride films on silicon substrate

за авторством Odarych, V.A., Sarsembaeva, A.Z., Sizov, F.F., Vuichyk, M.V.
Опубліковано 2005

Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry

за авторством Odarych, V.A., Sarsembaeva, A.Z., Vuichyk, M.V., Sizov, F.F.
Опубліковано 2006