Харвестер відкритої науки НАН України

Influence of elastic deformation on the residual ellipticity of polished optical materials

von Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Ellipsometric control of quality of polished MgF₂ optical ceramics

von Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials”

von Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry

von Odarych, V.A., Sarsembaeva, A.Z., Vuichyk, M.V., Sizov, F.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2006)

Investigation of cadmium telluride films on silicon substrate

von Odarych, V.A., Sarsembaeva, A.Z., Sizov, F.F., Vuichyk, M.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2005)