Influence of elastic deformation on the residual ellipticity of polished optical materials von Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.

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Ellipsometric control of quality of polished MgF₂ optical ceramics von Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.

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Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” von Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.

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Investigation of cadmium telluride films on silicon substrate von Odarych, V.A., Sarsembaeva, A.Z., Sizov, F.F., Vuichyk, M.V.

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Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry von Odarych, V.A., Sarsembaeva, A.Z., Vuichyk, M.V., Sizov, F.F.

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