Open Science Harvester of NAS of Ukraine

Influence of elastic deformation on the residual ellipticity of polished optical materials

by Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Ellipsometric control of quality of polished MgF₂ optical ceramics

by Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials”

by Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry

by Odarych, V.A., Sarsembaeva, A.Z., Vuichyk, M.V., Sizov, F.F.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2006)

Investigation of cadmium telluride films on silicon substrate

by Odarych, V.A., Sarsembaeva, A.Z., Sizov, F.F., Vuichyk, M.V.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2005)