Харвестер відкритої науки НАН України

Optical properties, form of granules and electronic parameters of binary Al/Cr composites

von Shaykevich, I.A., Kolesnyk, P.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2000)

Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique

von Rozouvan, T.S., Poperenko, L.V., Shaykevich, I.A.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2015)

Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation

von Shybiko, Ya.A., Shaykevich, I.A., Melnichenko, L.Yu.
Veröffentlicht in Functional Materials (2006)

Ellipsometric investigation of β-Si₃N₄ ceramics with Mo and Al additives

von Prokopets', V.M., Shaykevich, I.A., Robur, L.Y.
Veröffentlicht in Functional Materials (2005)

Optical properties of graphene film growing on a thin copper layer

von Rozouvan, T.S., Poperenko, L.V., Kravets, V.G., Shaykevich, I.A.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2016)

Influence of surface dimensional effects and interband transitions on absorption of light in aluminium

von Mеlnichenko, L.Yu., Tytarchuk, B.B., Shaykevich, I.A.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2002)

Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on surfaces of silicon photoelectric converters

von Donets, V.V., Melnichenko, L.Y., Shaykevich, I.A., Lomakina, O.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2009)

Optical properties of thin films of titanium with transient layers on them

von Lendel, V.V., Lomakina, O.V., Mel’nychenko, L.Yu., Shaykevich, I.A.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2010)