Low-frequency noise in nFinFETs of different dimensions processed in strained and non-strained SOI wafers von Lukyanchikova, N., Garbar, N., Kudina, V., Smolanka, A., Simoen, E., Claeys, C.

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Microfluctuations of oxygen impurity concentration as a reason of accelerated oxygen diffusion in silicon von Neimash, V.B., Puzenko, O.O., Kraitchinskii, A.M., Krasko, M.M., Putselyk, S., Claeys, C., Simoen, E.

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