Search Results - Tyagulski, I.P.

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    Effect of oxide-semiconductor interface traps on low-temperature operation of MOSFETs by Lysenko, V.S., Tyagulski, I.P., Gomeniuk, Y.V., Osiyuk, I.N.

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    Effect of the charge state of traps on the transport current in the SiC/Si heterostructure by Lysenko, V.S., Tyagulski, I.P., Gomeniuk, Y.V., Osiyuk, I.N.

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