Impurity concentration influence on the correlation of the x-ray lines intensity in metal-fullerene crystals by A. N. Drozdov, A. S. Vus, V. E. Pukha, A. T. Pugachev

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Physical Mechanisms of SiO2 Target Sputtering with Accelerated Ions of C60 by M. V. Maleev, E. N. Zubarev, V. E. Pukha, A. N. Drozdov, A. S. Vus

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The sputtering of silicon and carbon targets by accelerated ion by the fullerene C60 by M. V. Maleev, E. N. Zubarev, V. E. Pukha, A. N. Drozdov, A. S. Vus, Ju. Devizenko

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Features of the interaction of accelerated C60 ions with the ITO target surface by M. V. Maleev, E. N. Zubarev, V. E. Pukha, A. N. Drozdov, A. S. Vus, A. V. Penkov

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