Lashkaryov Institute of Semiconductor Physics NAS Ukraine — 50 years old

за авторством V. F. Machulin
Опубліковано 2010

X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates

за авторством N. V. Safriuk, G. V. Stanchu, A. V. Kuchuk, V. P. Kladko, A. E. Belyaev, V. F. Machulin
Опубліковано 2013

X-ray diffraction study of deformation state in InGaN/GaN multilayered structures

за авторством V. P. Kladko, A. V. Kuchuk, N. V. Safryuk, V. F. Machulin, A. E. Belyaev, R. V. Konakova, B. S. Yavich
Опубліковано 2010

Photochromic properties of composite films of thermally irreversible diarylethenes and fulgimides in polytetrafluoroethylene matrix

за авторством O. I. Kobeleva, T. M. Valova, A. O. Ait, V. A. Barachevsky, K. P. Grytsenko, V. F. Machulin, M. M. Krayushkin
Опубліковано 2011

Basic physics of multiparameter crystallography: diagnostics of defects of several types in single-crystal materials and articles of nanotechnologies

за авторством V. B. Molodkin, M. V. Kovalchuk, V. F. Machulin, Kh. Mukhamedzhanov, S. V. Lizunova, S. I. Olikhovskij, E. G. Len, B. V. Sheludchenko, S. V. Dmitriev, E. S. Skakunova, V. V. Molodkin, V. V. Lizunov, V. P. Kladko, E. V. Pervak
Опубліковано 2011