Lashkaryov Institute of Semiconductor Physics NAS Ukraine — 50 years old von V. F. Machulin

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X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates von N. V. Safriuk, G. V. Stanchu, A. V. Kuchuk, V. P. Kladko, A. E. Belyaev, V. F. Machulin

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X-ray diffraction study of deformation state in InGaN/GaN multilayered structures von V. P. Kladko, A. V. Kuchuk, N. V. Safryuk, V. F. Machulin, A. E. Belyaev, R. V. Konakova, B. S. Yavich

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Photochromic properties of composite films of thermally irreversible diarylethenes and fulgimides in polytetrafluoroethylene matrix von O. I. Kobeleva, T. M. Valova, A. O. Ait, V. A. Barachevsky, K. P. Grytsenko, V. F. Machulin, M. M. Krayushkin

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Basic physics of multiparameter crystallography: diagnostics of defects of several types in single-crystal materials and articles of nanotechnologies von V. B. Molodkin, M. V. Kovalchuk, V. F. Machulin, Kh. Mukhamedzhanov, S. V. Lizunova, S. I. Olikhovskij, E. G. Len, B. V. Sheludchenko, S. V. Dmitriev, E. S. Skakunova, V. V. Molodkin, V. V. Lizunov, V. P. Kladko, E. V. Pervak

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