Lashkaryov Institute of Semiconductor Physics NAS Ukraine — 50 years old by V. F. Machulin

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X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates by N. V. Safriuk, G. V. Stanchu, A. V. Kuchuk, V. P. Kladko, A. E. Belyaev, V. F. Machulin

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X-ray diffraction study of deformation state in InGaN/GaN multilayered structures by V. P. Kladko, A. V. Kuchuk, N. V. Safryuk, V. F. Machulin, A. E. Belyaev, R. V. Konakova, B. S. Yavich

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Photochromic properties of composite films of thermally irreversible diarylethenes and fulgimides in polytetrafluoroethylene matrix by O. I. Kobeleva, T. M. Valova, A. O. Ait, V. A. Barachevsky, K. P. Grytsenko, V. F. Machulin, M. M. Krayushkin

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Basic physics of multiparameter crystallography: diagnostics of defects of several types in single-crystal materials and articles of nanotechnologies by V. B. Molodkin, M. V. Kovalchuk, V. F. Machulin, Kh. Mukhamedzhanov, S. V. Lizunova, S. I. Olikhovskij, E. G. Len, B. V. Sheludchenko, S. V. Dmitriev, E. S. Skakunova, V. V. Molodkin, V. V. Lizunov, V. P. Kladko, E. V. Pervak

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