Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures

за авторством A. A. Efremov, V. G. Litovchenko, V. P. Melnik, O. S. Oberemok, V. G. Popov, B. M. Romanyuk
Опубліковано 2015

Formation of silicon nanoclusters in buried ultra-thin oxide layers

за авторством O. S. Oberemok, V. G. Litovchenko, D. V. Gamov, V. G. Popov, V. P. Melnik, Yo. Gudymenko, V. A. Nikirin, I. M. Khatsevich
Опубліковано 2011

Investigation of the Phase Interfaces in Periodic Multilayer Mo/Si Structures, Using the Method of Mass-Spectrometry of Neutral Particles

за авторством Ju. P. Pershin, V. A. Sevrjukova, E. N. Zubarev, A. S. Oberemok, V. P. Melnik, B. N. Romanjuk, V. G. Popov, P. M. Litvin
Опубліковано 2013

Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient

за авторством T. M. Sabov, O. S. Oberemok, O. V. Dubikovskyi, V. P. Melnik, V. P. Kladko, B. M. Romanyuk, V. G. Popov, Yo. Gudymenko, N. V. Safriuk
Опубліковано 2017

Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer

за авторством A. V. Sachenko, V. P. Kostylev, V. G. Litovchenko, V. G. Popov, B. M. Romanyuk, V. V. Chernenko, V. M. Naseka, T. V. Slusar, S. I. Kyrylova, F. F. Komarov
Опубліковано 2013

Research of recombination characteristics of Cz-Si implanted with iron ions

за авторством D. V. Gamov, O. I. Gudymenko, V. P. Kladko, V. G. Litovchenko, V. P. Melnik, O. S. Oberemok, V. G. Popov, Yu. O. Polishchuk, B. M. Romaniuk, V. V. Chernenko, V. M. Naseka
Опубліковано 2013