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V. G. Popov
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V. G. Popov
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V. G. Popov
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1
Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures
by
A. A. Efremov
,
V. G. Litovchenko
,
V. P. Melnik
,
O. S. Oberemok
,
V. G. Popov
,
B. M. Romanyuk
Published 2015
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Select result number 2
2
Formation of silicon nanoclusters in buried ultra-thin oxide layers
by
O. S. Oberemok
,
V. G. Litovchenko
,
D. V. Gamov
,
V. G. Popov
,
V. P. Melnik
,
Yo. Gudymenko
,
V. A. Nikirin
,
I. M. Khatsevich
Published 2011
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Select result number 3
3
Investigation of the Phase Interfaces in Periodic Multilayer Mo/Si Structures, Using the Method of Mass-Spectrometry of Neutral Particles
by
Ju. P. Pershin
,
V. A. Sevrjukova
,
E. N. Zubarev
,
A. S. Oberemok
,
V. P. Melnik
,
B. N. Romanjuk
,
V. G. Popov
,
P. M. Litvin
Published 2013
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4
Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient
by
T. M. Sabov
,
O. S. Oberemok
,
O. V. Dubikovskyi
,
V. P. Melnik
,
V. P. Kladko
,
B. M. Romanyuk
,
V. G. Popov
,
Yo. Gudymenko
,
N. V. Safriuk
Published 2017
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5
Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
by
A. V. Sachenko
,
V. P. Kostylev
,
V. G. Litovchenko
,
V. G. Popov
,
B. M. Romanyuk
,
V. V. Chernenko
,
V. M. Naseka
,
T. V. Slusar
,
S. I. Kyrylova
,
F. F. Komarov
Published 2013
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Select result number 6
6
Research of recombination characteristics of Cz-Si implanted with iron ions
by
D. V. Gamov
,
O. I. Gudymenko
,
V. P. Kladko
,
V. G. Litovchenko
,
V. P. Melnik
,
O. S. Oberemok
,
V. G. Popov
,
Yu. O. Polishchuk
,
B. M. Romaniuk
,
V. V. Chernenko
,
V. M. Naseka
Published 2013
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