Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures

by A. A. Efremov, V. G. Litovchenko, V. P. Melnik, O. S. Oberemok, V. G. Popov, B. M. Romanyuk
Published 2015

Formation of silicon nanoclusters in buried ultra-thin oxide layers

by O. S. Oberemok, V. G. Litovchenko, D. V. Gamov, V. G. Popov, V. P. Melnik, Yo. Gudymenko, V. A. Nikirin, I. M. Khatsevich
Published 2011

Investigation of the Phase Interfaces in Periodic Multilayer Mo/Si Structures, Using the Method of Mass-Spectrometry of Neutral Particles

by Ju. P. Pershin, V. A. Sevrjukova, E. N. Zubarev, A. S. Oberemok, V. P. Melnik, B. N. Romanjuk, V. G. Popov, P. M. Litvin
Published 2013

Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient

by T. M. Sabov, O. S. Oberemok, O. V. Dubikovskyi, V. P. Melnik, V. P. Kladko, B. M. Romanyuk, V. G. Popov, Yo. Gudymenko, N. V. Safriuk
Published 2017

Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer

by A. V. Sachenko, V. P. Kostylev, V. G. Litovchenko, V. G. Popov, B. M. Romanyuk, V. V. Chernenko, V. M. Naseka, T. V. Slusar, S. I. Kyrylova, F. F. Komarov
Published 2013

Research of recombination characteristics of Cz-Si implanted with iron ions

by D. V. Gamov, O. I. Gudymenko, V. P. Kladko, V. G. Litovchenko, V. P. Melnik, O. S. Oberemok, V. G. Popov, Yu. O. Polishchuk, B. M. Romaniuk, V. V. Chernenko, V. M. Naseka
Published 2013