On the establishment of a state key laboratory for the microelectronics development in Ukraine (transcript of report at the meeting of the Presidium of NAS of Ukraine, November 24,... von V. P. Kladko

Volltext

Modeling of X-ray rocking curves for layers after two-stage ion-implantation von O. I. Liubchenko, V. P. Kladko, Yo. Gudymenko

Volltext

Investigation of Plasmon Gold Film Nanostructures by Means of both X-Ray Reflectometry and Diffractometry von A. I. Gudymenko, S. B. Krivoj, G. V. Stanchu, V. P. Kladko, N. V. Safrjuk, N. V. Slobodjan

Volltext

Significance of DX-centers for acoustic induced reconstruction processes of defects in GaN/AlGaN von Ya. M. Olikh, M. D. Tymochko, V. P. Kladko, O. I. Liubchenko, Ye. Bieliaiev, V. V. Kaliuzhnyi

Volltext

Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry von I. M. Fodchuk, V. V. Dovganyuk, T. V. Litvinchuk, V. P. Kladko, M. V. Slobodian, Yo. Gudymenko, Z. Swiatek

Volltext

Investigation of traps in AlGaN/GaN heterostructures by ultrasonic vibrations von V. V. Kaliuzhnyi, O. I. Liubchenko, M. D. Tymochko, Y. M. Olikh, V. P. Kladko, A. E. Belyaev

Volltext

Investigation of traps in AlGaN/GaN heterostructures by ultrasonic vibrations von V. V. Kaliuzhnyi, O. I. Liubchenko, M. D. Tymochko, Y. M. Olikh, V. P. Kladko, A. E. Belyaev

Volltext

X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates von N. V. Safriuk, G. V. Stanchu, A. V. Kuchuk, V. P. Kladko, A. E. Belyaev, V. F. Machulin

Volltext

The effect of ion implantation on structural damage in compositionally graded AlGaN layers von O. I. Liubchenko, V. P. Kladko, H. V. Stanchu, T. M. Sabov, V. P. Melnik, S. B. Kryvyi, A. E. Belyaev

Volltext

X-ray diffraction study of deformation state in InGaN/GaN multilayered structures von V. P. Kladko, A. V. Kuchuk, N. V. Safryuk, V. F. Machulin, A. E. Belyaev, R. V. Konakova, B. S. Yavich

Volltext

Photoluminescence properties of silicon nanoparticlesinmultilayered (SiOx-SiOy)n structures with porousinsulatinglayers von K. V. Mykhailovska, V. A. Danko, O. Y. Hudymenko, V. P. Kladko, I. Z. Indutnyi, Ye. Shepeliavyi, M. V. Sopinskyi

Volltext

Reflectometry study of nanoporous films with arrays of gold nanoparticles von V. P. Kladko, O. Y. Gudymenko, S. B. Kriviy, P. M. Litvin, E. B. Kaganovich, I. M. Krishchenko, E. G. Manoilov

Volltext

Reflectometry study of nanoporous films with arrays of gold nanoparticles von V. P. Kladko, O. Y. Hudymenko, S. B. Kryvyi, P. M. Lytvyn, E. B. Kahanovych, I. M. Krishchenko, E. H. Manoilov

Volltext

Influence of microwave radiation on relaxation processes in silicon carbide von Yu. Yu. Bacherikov, Yu. Goroneskul, Yo. Gudymenko, V. P. Kladko, O. F. Kolomys, I. M. Krishchenko, O. B. Okhrimenko, V. V. Strelchuk

Volltext

Influence of small miscuts on self-ordered growth of Ge nanoislands von Yo. Gudymenko, V. P. Kladko, O. M. Yefanov, M. V. Slobodian, Yu. S. Polischuk, Z. F. Krasilnik, D. V. Lobanov, A. A. Novikov

Volltext

Magnetron nc-TiC/a-C nanocomposite coatings von Ju. S. Borisov, M. V. Kuznetsov, A. V. Volos, V. G. Zadoja, L. M. Kapitanchuk, V. V. Strelchuk, V. P. Kladko, V. F. Gorban

Volltext

Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient von T. M. Sabov, O. S. Oberemok, O. V. Dubikovskyi, V. P. Melnik, V. P. Kladko, B. M. Romanyuk, V. G. Popov, Yo. Gudymenko, N. V. Safriuk

Volltext

Preparation and study of the porous Si surfaces obtained by electrochemical method von V. G. Lytovchenko, T. I. Gorbanyuk, V. P. Kladko, A. V. Sarikov, N. V. Safriuk, L. L. Fedorenko, S. Asmontas, J. Gradauskas, E. Sirmulis, O. Zalys

Volltext

Morphology and optical properties of tetragonal Ge nanoclusters grown on chemically oxidized Si(100) surfaces von V. S. Lysenko, S. V. Kondratenko, Yu. N. Kozyrev, Yu. Rubezhanska, V. P. Kladko, Yu. V. Gomeniuk, O. Y. Gudymenko, Ye. Ye. Melnichuk, G. Grenet, N. B. Blanchard

Volltext

Morphology and optical properties of tetragonal Ge nanoclusters grown on chemically oxidized Si(100) surfaces von V. S. Lysenko, S. V. Kondratenko, Yu. M. Kozyrev, Yu. Rubezhanska, V. P. Kladko, Yu. V. Homeniuk, O. Y. Hudymenko, Ye. Ye. Melnychuk, Zh. Hrene, N. B. Blanshar

Volltext