On the establishment of a state key laboratory for the microelectronics development in Ukraine (transcript of report at the meeting of the Presidium of NAS of Ukraine, November 24,... за авторством V. P. Kladko

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Modeling of X-ray rocking curves for layers after two-stage ion-implantation за авторством O. I. Liubchenko, V. P. Kladko, Yo. Gudymenko

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Investigation of Plasmon Gold Film Nanostructures by Means of both X-Ray Reflectometry and Diffractometry за авторством A. I. Gudymenko, S. B. Krivoj, G. V. Stanchu, V. P. Kladko, N. V. Safrjuk, N. V. Slobodjan

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Significance of DX-centers for acoustic induced reconstruction processes of defects in GaN/AlGaN за авторством Ya. M. Olikh, M. D. Tymochko, V. P. Kladko, O. I. Liubchenko, Ye. Bieliaiev, V. V. Kaliuzhnyi

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Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry за авторством I. M. Fodchuk, V. V. Dovganyuk, T. V. Litvinchuk, V. P. Kladko, M. V. Slobodian, Yo. Gudymenko, Z. Swiatek

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Investigation of traps in AlGaN/GaN heterostructures by ultrasonic vibrations за авторством V. V. Kaliuzhnyi, O. I. Liubchenko, M. D. Tymochko, Y. M. Olikh, V. P. Kladko, A. E. Belyaev

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Investigation of traps in AlGaN/GaN heterostructures by ultrasonic vibrations за авторством V. V. Kaliuzhnyi, O. I. Liubchenko, M. D. Tymochko, Y. M. Olikh, V. P. Kladko, A. E. Belyaev

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X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates за авторством N. V. Safriuk, G. V. Stanchu, A. V. Kuchuk, V. P. Kladko, A. E. Belyaev, V. F. Machulin

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The effect of ion implantation on structural damage in compositionally graded AlGaN layers за авторством O. I. Liubchenko, V. P. Kladko, H. V. Stanchu, T. M. Sabov, V. P. Melnik, S. B. Kryvyi, A. E. Belyaev

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X-ray diffraction study of deformation state in InGaN/GaN multilayered structures за авторством V. P. Kladko, A. V. Kuchuk, N. V. Safryuk, V. F. Machulin, A. E. Belyaev, R. V. Konakova, B. S. Yavich

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Photoluminescence properties of silicon nanoparticlesinmultilayered (SiOx-SiOy)n structures with porousinsulatinglayers за авторством K. V. Mykhailovska, V. A. Danko, O. Y. Hudymenko, V. P. Kladko, I. Z. Indutnyi, Ye. Shepeliavyi, M. V. Sopinskyi

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Reflectometry study of nanoporous films with arrays of gold nanoparticles за авторством V. P. Kladko, O. Y. Gudymenko, S. B. Kriviy, P. M. Litvin, E. B. Kaganovich, I. M. Krishchenko, E. G. Manoilov

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Reflectometry study of nanoporous films with arrays of gold nanoparticles за авторством V. P. Kladko, O. Y. Hudymenko, S. B. Kryvyi, P. M. Lytvyn, E. B. Kahanovych, I. M. Krishchenko, E. H. Manoilov

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Influence of microwave radiation on relaxation processes in silicon carbide за авторством Yu. Yu. Bacherikov, Yu. Goroneskul, Yo. Gudymenko, V. P. Kladko, O. F. Kolomys, I. M. Krishchenko, O. B. Okhrimenko, V. V. Strelchuk

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Influence of small miscuts on self-ordered growth of Ge nanoislands за авторством Yo. Gudymenko, V. P. Kladko, O. M. Yefanov, M. V. Slobodian, Yu. S. Polischuk, Z. F. Krasilnik, D. V. Lobanov, A. A. Novikov

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Magnetron nc-TiC/a-C nanocomposite coatings за авторством Ju. S. Borisov, M. V. Kuznetsov, A. V. Volos, V. G. Zadoja, L. M. Kapitanchuk, V. V. Strelchuk, V. P. Kladko, V. F. Gorban

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Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient за авторством T. M. Sabov, O. S. Oberemok, O. V. Dubikovskyi, V. P. Melnik, V. P. Kladko, B. M. Romanyuk, V. G. Popov, Yo. Gudymenko, N. V. Safriuk

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Preparation and study of the porous Si surfaces obtained by electrochemical method за авторством V. G. Lytovchenko, T. I. Gorbanyuk, V. P. Kladko, A. V. Sarikov, N. V. Safriuk, L. L. Fedorenko, S. Asmontas, J. Gradauskas, E. Sirmulis, O. Zalys

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Morphology and optical properties of tetragonal Ge nanoclusters grown on chemically oxidized Si(100) surfaces за авторством V. S. Lysenko, S. V. Kondratenko, Yu. N. Kozyrev, Yu. Rubezhanska, V. P. Kladko, Yu. V. Gomeniuk, O. Y. Gudymenko, Ye. Ye. Melnichuk, G. Grenet, N. B. Blanchard

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Morphology and optical properties of tetragonal Ge nanoclusters grown on chemically oxidized Si(100) surfaces за авторством V. S. Lysenko, S. V. Kondratenko, Yu. M. Kozyrev, Yu. Rubezhanska, V. P. Kladko, Yu. V. Homeniuk, O. Y. Hudymenko, Ye. Ye. Melnychuk, Zh. Hrene, N. B. Blanshar

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