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Unique informativity of the diffuse dynamical combined diffractometry of materials and products of nanotechnologies von A. P. Shpak, M. V. Kovalchuk, I. M. Karnaukhov, V. V. Molodkin, E. G. Len, A. I. Nizkova, S. I. Olikhovskij, B. V. Sheludchenko, Dzh. E. Ajs, R. I. Barabash

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New approaches and possibilities of a dynamical diffractometry of imperfections of multiparameter systems von V. V. Lizunov, V. B. Molodkin, S. V. Lizunova, N. G. Tolmachev, E. S. Skakunova, S. V. Dmitriev, B. V. Sheludchenko, S. M. Brovchuk, L. N. Skapa, R. V. Lekhnjak, V. V. Molodkin, E. V. Fuzik

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Integral multiparameter diffractometry of nanosystems on the basis of effects of multiplicity of diffuse scattering von A. P. Shpak, M. V. Kovalchuk, V. B. Molodkin, V. L. Nosik, S. V. Dmitriev, E. G. Len, S. I. Olikhovskij, A. I. Nizkova, V. V. Molodkin, E. V. Pervak, A. A. Katasonov, L. I. Ninichuk, A. V. Melnik

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Basic physics of multiparameter crystallography: diagnostics of defects of several types in single-crystal materials and articles of nanotechnologies von V. B. Molodkin, M. V. Kovalchuk, V. F. Machulin, Kh. Mukhamedzhanov, S. V. Lizunova, S. I. Olikhovskij, E. G. Len, B. V. Sheludchenko, S. V. Dmitriev, E. S. Skakunova, V. V. Molodkin, V. V. Lizunov, V. P. Kladko, E. V. Pervak

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