Effective thickness of the planar detector in measurements of electrons energy loss by Deiev, O.S., Kiprich, S.K., Vasilyev, G.P., Yalovenko, V.I., Ovchinnik, V.D., Shulika, M.Y.

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Development of technique for testing the long-term stability of silicon microstrip detectors by Kosinov, A.V., Maslov, N. I., Naumov, S. V., Ovchinni, V. D., Starodubtsev, A. F., Vasilyev, G. P., Yalovenko, V. I., Bosisio, L.

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Temperature dependence of the energy resolution and leakage current of the planar silicone detectors by Deiev, O.S., Maslov, N.I., Ovchinnik, V.D., Potin, S.M., Shulika, M.Y., Vasilyev, G.P., Voloshyn, V.K., Yalovenko, V.I.

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