On the dielectric approximation in the additional light waves theory: an historical rehabilitation (recovery) за авторством Piskovoi, V.N., Venger, E.F.

Отримати повний текст

About manifestation of the piezojunction effect in diode temperature sensors за авторством Borblik, V.L., Shwarts, Yu.M., Venger, E.F.

Отримати повний текст

The features of phonon component of linear dichroism in uniaxially strained silicon crystals за авторством Serdega, B.K., Venger, E.F., Matyash, I.E.

Отримати повний текст

Development of the physical insight into the nature of the factors that control electrophysical and other properties of semiconductors за авторством Baranskii, P.I., Babich, V.M., Venger, E.F.

Отримати повний текст

Resonance generation of sum harmonic in static electric field за авторством Venger, E.F., Griban, V.M., Melnichuk, A.V.

Отримати повний текст

Investigation of the undersurface damaged layers in silicon wafers за авторством Holiney, R.Yu., Matveeva, L.A., Venger, E.F.

Отримати повний текст

Piezoelectrically active acoustic waves confined in a quantum well and their amplification by electron drift за авторством Demidenko, A.A., Kochelap, V.A., Venger, E.F.

Отримати повний текст

Effect of mechanical stress on operation of diode temperature sensors за авторством Borblik, V.L., Shwarts, Yu.M., Venger, E.F.

Отримати повний текст

Effect of oxidation of catalytically active silicon-based electrodes on water decomposition за авторством Primachenko, V.E., Serba, O.A., Chernobai, V.A., Venger, E.F.

Отримати повний текст

Influence of some physico-chemical factors on properties of electrodes that decompose water catalytically за авторством Primachenko, V.E., Serba, O.A., Chernobai, V.A., Venger, E.F.

Отримати повний текст

Peculiarities of injection phenomena in heavily doped silicon structures and development of radiation-resistant diode temperature sensors за авторством Shwarts, Yu.M., Sokolov, V.N., Shwarts, M.M., Venger, E.F.

Отримати повний текст

Investigation of ZnO single crystals subjected to a high uniform magnetic field in the IR spectral range за авторством Venger, E.F., Evtushenko, A.I., Melnichuk, L.Yu., Melnichuk, O.V.

Отримати повний текст

Spectra of the photo-electric phenomena physically differentiated on the light absorption factor за авторством Berezhinsky, L.I., Venger, E.F., Matyash, I.E., Serdega, B.K.

Отримати повний текст

Electronic properties of silicon surface at different oxide film conditions за авторством Kirillova, S.I., Primachenko, V.E., Venger, E.F., Chernobai, V.A.

Отримати повний текст

Digital aroma technology for chemical sensing: temporal chemical images of complex mixtures за авторством Kruglenko, I.V., Snopok, B.A., Shirshov, Y.M., Venger, E.F.

Отримати повний текст

Analysis of the fundamental absorption edge of the films obtained from the C₆₀ fullerene molecular beam in vacuum and effect of internal mechanical stresses on it за авторством Kolyadina, E.Yu., Matveeva, L.A., Neluba, P.L., Venger, E.F.

Отримати повний текст

Surface polariton excitation in ZnO films deposited using ALD за авторством Venger, E.F., Melnichuk, L.Yu., Melnichuk, A.V., Semikina, T.V.

Отримати повний текст

Synthesis and properties of semiconductor solid solutions (inSb)₁₋x(CdTe)x за авторством Venger, E.F., Knorozok, L.M., Melnichuk, L.Yu., Melnichuk, O.V.

Отримати повний текст

Electron states at the Si–SiO₂ boundary (Review) за авторством Primachenko, V.E., Kirillova, S.I., Venger, E.F., Chernobai, V.A.

Отримати повний текст

Quantum-size effects in semiconductor heterosystems за авторством Matveeva, L.A., Venger, E.F., Kolyadina, E.Yu., Neluba, P.L.

Отримати повний текст