Search Results - Vlasenko, A.I.

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    Electron properties of semiconductor surface studied by the electroreflectance spectroscopy method by Gentsar, P.A., Vlasenko, A.I., Kudryavtsev, A.A.

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    Acoustic-emission method for controlling the defect-formation process in light-emitting structures by Lyashenko, O.V., Vlasenko, A.I., Veleschuk, V.P., Kisseluk, M.P.

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