X-ray lines relative intensity depending on detector efficiency, foils and cases thickness for primary and scattered spectra von Bochek, G.L., Deiev, O.S., Maslov, N.I., Voloshyn, V.K.

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Temperature dependence of the energy resolution and leakage current of the planar silicone detectors von Deiev, O.S., Maslov, N.I., Ovchinnik, V.D., Potin, S.M., Shulika, M.Y., Vasilyev, G.P., Voloshyn, V.K., Yalovenko, V.I.

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