Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements

за авторством Yu. V. Gomeniuk
Опубліковано 2012

Morphology and optical properties of tetragonal Ge nanoclusters grown on chemically oxidized Si(100) surfaces

за авторством V. S. Lysenko, S. V. Kondratenko, Yu. N. Kozyrev, Yu. Rubezhanska, V. P. Kladko, Yu. V. Gomeniuk, O. Y. Gudymenko, Ye. Ye. Melnichuk, G. Grenet, N. B. Blanchard
Опубліковано 2012

Electroluminescent properties of Tb-doped carbon-enriched silicon oxide

за авторством S. I. Tiagulskyi, A. N. Nazarov, S. O. Gordienko, A. V. Vasin, A. V. Rusavsky, T. M. Nazarova, Yu. V. Gomeniuk, V. S. Lysenko, L. Rebohle, M. Voelskow, W. Skorupa, Y. Koshka
Опубліковано 2014