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Raman spectroscopy and X-ray diffraction studies of (GeS₂)₁₀₀₋x(SbSI)x glasses and composites on their basis von Rubish, V.M., Stefanovich, V.O., Maryan, V.M., Mykaylo, O.A., Shtets, P.P., Kaynts, D.I., Yurkin, I.M.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2014)Volltext
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