Buchumschlag

Surface chemscal states of Cu2HgGeSe4 studied by X-ray photoelectron spectroscopy

The electronic structure and surface chemical states of a Cu2HgGeSe4 single crystal, grown by the Bridgman–Stockbarger method, were investigated using X-ray photoelectron spectroscopy (XPS) for pristine and Ar+ ion-irradiated surfaces. High-resolution core-level XPS spectra (Cu 2p, Hg 4f, Ge 3d, Se...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Datum:2019
Hauptverfasser: Tkach, Vira, O.Y. Khyzhun, N.M. Denysyuk, Luzhnyi Ivan Vasyliovych, Kopylova Kateryna Ihorivna
Format: Data
Sprache:Englisch
Veröffentlicht: DataverseUA 2019
Schlagworte:
Chemistry
Engineering
Physics
Semiconductors
X-ray photoelectronic spectra
Electronic structure
Online Zugang:https://doi.org/10.48788/DVUA/DGS7UW
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:Open Data Repository of the National Academy of Sciences of Ukraine

Institution

Open Data Repository of the National Academy of Sciences of Ukraine
Beschreibung
Zusammenfassung:The electronic structure and surface chemical states of a Cu2HgGeSe4 single crystal, grown by the Bridgman–Stockbarger method, were investigated using X-ray photoelectron spectroscopy (XPS) for pristine and Ar+ ion-irradiated surfaces. High-resolution core-level XPS spectra (Cu 2p, Hg 4f, Ge 3d, Se 3d, Se 3p) and valence-band spectra were recorded before and after Ar+ ion sputtering to evaluate the core-level binding energies, chemical state preservation, and structural stability of the Cu2HgGeSe4 surface under ion-beam treatment.

Ähnliche Einträge