Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)
The atomic force microscopy was used to analyze the effect of the insulator matrix on the morphology of iron-insulator discontinuous multilayers [Fe/I]n/S (I = SiO2, HfO2, and MgO)
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| Date: | 2026 |
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| Main Authors: | , , , |
| Format: | Data |
| Published: |
DataverseUA
2026
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| Subjects: | |
| Online Access: | https://doi.org/10.48788/DVUA/FJ9M9G |
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| Journal Title: | Open Data Repository of the National Academy of Sciences of Ukraine |