Analysis of Ag2HgSnS4 Compound by X-ray photoelectron spectroscopy

• Datum: 2014
• Hauptverfasser: Tkach, Vira, O.Y. Khyzhun, N.M. Denysіuk, Kopylova Kateryna Ihorivna
• Format: Data
• Sprache: Englisch
• Veröffentlicht: DataverseUA 2014
• Schlagworte: Chemistry; Engineering; Physics; Semiconductors; X-ray photoelectron spectroscopy; Electronic structure; Ag2HgSnS4; Quaternary chalcogenide; Core-level spectra; Valence-band spectrum; Surface composition
• Online Zugang: https://doi.org/10.48788/DVUA/U6JWSR
• Назва журналу: Open Data Repository of the National Academy of Sciences of Ukraine

This dataset contains survey, high-resolution core-level, and valence-band X-ray photoelectron spectroscopy (XPS) data obtained from the pristine surface of an Ag2HgSnS4 single crystal grown by the Bridgman–Stockbarger technique. The deposited files cover the Ag 3d, Hg 4f, Sn 3d, and S 2p core levels together with the valence-band region and include both numerical spectral data and corresponding graphical representations. The data can be used to examine the elemental composition, core-level electronic states, and valence electronic structure of the untreated Ag2HgSnS4 single-crystal surface. All deposited spectra correspond to the pristine surface.