STATISTIC METHODS OF POLYIMIDE ENAMEL ISOLATION DEFECTIVE NON-DESTRUCTIVE CONTROL AT THE CONDITIONS OF PRODUCTION

In this paper can be used to not-destructive technological testing of defects isolation enameled wire with polyimide polymer. The thesis is devoted to the statistical method for processing, comparison and analysis of results of measurements of parameters isolation it enameled wire because of mathema...

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Datum:2017
Hauptverfasser: Golik, O. V., Shchebeniuk, L. A.
Format: Artikel
Sprache:English
Ukrainian
Veröffentlicht: National Technical University "Kharkiv Polytechnic Institute" and Аnatolii Pidhornyi Institute of Power Machines and Systems of NAS of Ukraine 2017
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Online Zugang:http://eie.khpi.edu.ua/article/view/2074-272X.2017.1.08
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Назва журналу:Electrical Engineering & Electromechanics

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Electrical Engineering & Electromechanics
Beschreibung
Zusammenfassung:In this paper can be used to not-destructive technological testing of defects isolation enameled wire with polyimide polymer. The thesis is devoted to the statistical method for processing, comparison and analysis of results of measurements of parameters isolation it enameled wire because of mathematical model of trend for application in active technological monitoring is developed; to development used of the recommendations for parameters of such testing. Is theoretically justified and the possibility of a diminution of dependence of an error from a velocity of movement of a wire for want of quantifying of defects enameled isolation not destroying tests by high voltage. This work is devoted to the statistical method for processing, comparison and analysis of results of measurements of parameters of polyimide isolation. The method is operating not destroying technological monitoring an amount of enameled isolation defect. The dependence of average value of amount of defects for enameled wire ПЭЭИДХ2 – 200 with two–sheeted polyimide by isolation in a range of nominal diameter 0.56 mm is experimentally determined. The technological monitoring purpose is reducing of quantifying of enameled isolation defect.