Metal micro-detectors: development of “transparent” position sensitive detector for beam diagnostics

Metal Micro-strip Detector (MMD) represents a novel position sensitive detector for wide range of applications. The main advantages of MMD are low thickness, high radiation resistance and high spatial resolution. MMD production technology includes some stages: micro-strip layout made by photo-lithog...

Повний опис

Збережено в:
Бібліографічні деталі
Дата:2012
Автор: O. Fedorovich, O. Kovalchuk, V. Pugatch, O. Okhrimenko, D. Storozhyk, V. Kyva
Формат: Стаття
Мова:English
Опубліковано: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2012
Назва видання:Вопросы атомной науки и техники
Теми:
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/109208
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Metal micro-detectors: development of “transparent” position sensitive detector for beam diagnostics / O. Fedorovich, O. Kovalchuk, V. Pugatch, O. Okhrimenko, D. Storozhyk, V. Kyva // Вопросы атомной науки и техники. — 2012. — № 6. — С. 196-198. — Бібліогр.: 6 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
Опис
Резюме:Metal Micro-strip Detector (MMD) represents a novel position sensitive detector for wide range of applications. The main advantages of MMD are low thickness, high radiation resistance and high spatial resolution. MMD production technology includes some stages: micro-strip layout made by photo-lithography on silicon wafer, plasma-chemistry etching of the silicon wafer in the operating window, micro-cabling connection to the readout electronics and DAQ. Commercially available read-out systems (VA_SCM3 microchip preamplifier, Time Pix readout chip, Gotthard, X-DAS) have been studied for use with MMD. Characterization studies of the MMD are presented in details.