Aberrations in electromagnetic plasma lenses proposed for intense large-aperture ion beam focusing
It is shown, that in electromagnetic plasma lenses moment aberrations obey the conservation law of the moment of the ion generalized momentum; they disappear when an ion source is placed in a zero magnetic field. Geometrical aberrations can be removed by choice of the optimal electric field intensit...
Збережено в:
Дата: | 2003 |
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Автори: | , |
Формат: | Стаття |
Мова: | English |
Опубліковано: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2003
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Назва видання: | Вопросы атомной науки и техники |
Теми: | |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/110539 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Aberrations in electromagnetic plasma lenses proposed for intense large-aperture ion beam focusing / V.I. Butenko, B.I. Ivanov // Вопросы атомной науки и техники. — 2003. — № 1. — С. 121-124. — Бібліогр.: 11 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of UkraineРезюме: | It is shown, that in electromagnetic plasma lenses moment aberrations obey the conservation law of the moment of the ion generalized momentum; they disappear when an ion source is placed in a zero magnetic field. Geometrical aberrations can be removed by choice of the optimal electric field intensity distribution along the radius that have been calculated. As a result, the ion current density and beam compression can achieve in the focus a value up to 10³ A/cm², and 10⁵, accordingly. Then influence of discrete distribution of the external (boundary) electrical potential upon ion focusing was studied, and an example of two-lens achromatic system have been investigated as well. |
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