Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation
The soft X-ray (SXR) measurements were received with help of the fast semiconductor detectors SPPD11-04 with exposure time about 1.5 ns. Observation directions were at 45° and 90° to the chamber axis. The SXR dependence from pressure was designed. The radiation maximum corresponded to argon pressure...
Збережено в:
| Дата: | 2008 |
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| Автори: | , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2008
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| Назва видання: | Вопросы атомной науки и техники |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/111026 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation / S.P. Eliseev, V.Ya. Nikulin, P.V. Silin // Вопросы атомной науки и техники. — 2008. — № 6. — С. 222-224. — Бібліогр.: 2 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | The soft X-ray (SXR) measurements were received with help of the fast semiconductor detectors SPPD11-04 with exposure time about 1.5 ns. Observation directions were at 45° and 90° to the chamber axis. The SXR dependence from pressure was designed. The radiation maximum corresponded to argon pressure equals to 2 Torr. The full width at half-maximum of the pulse at this pressure and a voltage of 12 kV was 5 ns. The SXR radiation dependence was investigated from the capacitor banks voltage (8-14 kV) in the two ranges of energy 1.2-1.8 and 2.9-3.5 keV. At the voltage of 14 kV and an argon pressure of 2 Torr the quantity of radiation quanta was estimated about 8·10¹⁴, the total radiation energy ~ 0.2 J and power ~ 7·10⁶ W in 4π geometry. |
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