Enhanced 2D plotting method for scanning probe microscopy imaging

An enhanced 2D plotting method for scanning probe microscopy imaging implementing a gradient-based value mapping for pseudocolor images and its application to studies of epitaxial layer surface morphology is presented. It is demonstrated that this method is capable of revealing the finest features o...

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Бібліографічні деталі
Дата:2011
Автор: Beketov, G.V.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2011
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/117627
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Enhanced 2D plotting method for scanning probe microscopy imaging / G.V. Beketov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 1. — С. 80-87. — Бібліогр.: 27 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1176272017-05-26T03:03:08Z Enhanced 2D plotting method for scanning probe microscopy imaging Beketov, G.V. An enhanced 2D plotting method for scanning probe microscopy imaging implementing a gradient-based value mapping for pseudocolor images and its application to studies of epitaxial layer surface morphology is presented. It is demonstrated that this method is capable of revealing the finest features on growth surfaces. Presence of elementary growth steps on the surface of flat-topped hillocks found on Hg₀.₈Cd₀.₂Te LPE-grown epitaxial layers, examples of cooperative effects of screw dislocations on PbTe and Hg₁₋xCdxTe epilayer growth as well as atypical surface morphology of PbTe epilayers are discussed. 2011 Article Enhanced 2D plotting method for scanning probe microscopy imaging / G.V. Beketov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 1. — С. 80-87. — Бібліогр.: 27 назв. — англ. 1560-8034 PACS 68.37.Ps, 81.16.-c http://dspace.nbuv.gov.ua/handle/123456789/117627 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description An enhanced 2D plotting method for scanning probe microscopy imaging implementing a gradient-based value mapping for pseudocolor images and its application to studies of epitaxial layer surface morphology is presented. It is demonstrated that this method is capable of revealing the finest features on growth surfaces. Presence of elementary growth steps on the surface of flat-topped hillocks found on Hg₀.₈Cd₀.₂Te LPE-grown epitaxial layers, examples of cooperative effects of screw dislocations on PbTe and Hg₁₋xCdxTe epilayer growth as well as atypical surface morphology of PbTe epilayers are discussed.
format Article
author Beketov, G.V.
spellingShingle Beketov, G.V.
Enhanced 2D plotting method for scanning probe microscopy imaging
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Beketov, G.V.
author_sort Beketov, G.V.
title Enhanced 2D plotting method for scanning probe microscopy imaging
title_short Enhanced 2D plotting method for scanning probe microscopy imaging
title_full Enhanced 2D plotting method for scanning probe microscopy imaging
title_fullStr Enhanced 2D plotting method for scanning probe microscopy imaging
title_full_unstemmed Enhanced 2D plotting method for scanning probe microscopy imaging
title_sort enhanced 2d plotting method for scanning probe microscopy imaging
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2011
url http://dspace.nbuv.gov.ua/handle/123456789/117627
citation_txt Enhanced 2D plotting method for scanning probe microscopy imaging / G.V. Beketov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 1. — С. 80-87. — Бібліогр.: 27 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT beketovgv enhanced2dplottingmethodforscanningprobemicroscopyimaging
first_indexed 2023-10-18T20:30:14Z
last_indexed 2023-10-18T20:30:14Z
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