Polarization analysis of birefringence in uniaxially deformed silicon crystals

The birefringence induced by uniaxial compression in low-doped silicon crystals was investigated both theoretically and experimentally. The circular components of the Stokes vector in the transmission and reflectance radiation are measured as a function of external pressure by using the method ba...

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Бібліографічні деталі
Дата:2007
Автори: Berezhinsky, L.I., Berezhinsky, I.L., Pipa, V.I., Matyash, I.Ye., Serdega, B.K.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2007
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/117773
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Polarization analysis of birefringence in uniaxially deformed silicon crystals / L.I. Berezhinsky, I.L. Berezhinsky, V.I. Pipa, I.Ye. Matyash, B.K. Serdega // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 1. — С. 49-54. — Бібліогр.: 12 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1177732017-05-27T03:06:05Z Polarization analysis of birefringence in uniaxially deformed silicon crystals Berezhinsky, L.I. Berezhinsky, I.L. Pipa, V.I. Matyash, I.Ye. Serdega, B.K. The birefringence induced by uniaxial compression in low-doped silicon crystals was investigated both theoretically and experimentally. The circular components of the Stokes vector in the transmission and reflectance radiation are measured as a function of external pressure by using the method based on the modulation of radiation polarization. The value of the Brewster constant was obtained for absorption (λ = 0.63 µm) and transparence (λ = 1.15 µm) regions. The obtained experimental data are in a good agreement with calculation results based on the anisotropy model of dielectric properties within the framework of the Hook law. Shown is the practical importance of the polarization analysis in researching anisotropy of dielectric properties of materials. 2007 Article Polarization analysis of birefringence in uniaxially deformed silicon crystals / L.I. Berezhinsky, I.L. Berezhinsky, V.I. Pipa, I.Ye. Matyash, B.K. Serdega // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 1. — С. 49-54. — Бібліогр.: 12 назв. — англ. 1560-8034 PACS 78.20.Fm http://dspace.nbuv.gov.ua/handle/123456789/117773 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description The birefringence induced by uniaxial compression in low-doped silicon crystals was investigated both theoretically and experimentally. The circular components of the Stokes vector in the transmission and reflectance radiation are measured as a function of external pressure by using the method based on the modulation of radiation polarization. The value of the Brewster constant was obtained for absorption (λ = 0.63 µm) and transparence (λ = 1.15 µm) regions. The obtained experimental data are in a good agreement with calculation results based on the anisotropy model of dielectric properties within the framework of the Hook law. Shown is the practical importance of the polarization analysis in researching anisotropy of dielectric properties of materials.
format Article
author Berezhinsky, L.I.
Berezhinsky, I.L.
Pipa, V.I.
Matyash, I.Ye.
Serdega, B.K.
spellingShingle Berezhinsky, L.I.
Berezhinsky, I.L.
Pipa, V.I.
Matyash, I.Ye.
Serdega, B.K.
Polarization analysis of birefringence in uniaxially deformed silicon crystals
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Berezhinsky, L.I.
Berezhinsky, I.L.
Pipa, V.I.
Matyash, I.Ye.
Serdega, B.K.
author_sort Berezhinsky, L.I.
title Polarization analysis of birefringence in uniaxially deformed silicon crystals
title_short Polarization analysis of birefringence in uniaxially deformed silicon crystals
title_full Polarization analysis of birefringence in uniaxially deformed silicon crystals
title_fullStr Polarization analysis of birefringence in uniaxially deformed silicon crystals
title_full_unstemmed Polarization analysis of birefringence in uniaxially deformed silicon crystals
title_sort polarization analysis of birefringence in uniaxially deformed silicon crystals
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2007
url http://dspace.nbuv.gov.ua/handle/123456789/117773
citation_txt Polarization analysis of birefringence in uniaxially deformed silicon crystals / L.I. Berezhinsky, I.L. Berezhinsky, V.I. Pipa, I.Ye. Matyash, B.K. Serdega // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 1. — С. 49-54. — Бібліогр.: 12 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
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first_indexed 2023-10-18T20:30:35Z
last_indexed 2023-10-18T20:30:35Z
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