Frequency-dependent dielectric coefficients of TlInS₂ amorphous films
The frequency dispersion of the loss tangent (tgδ) and the ac conductivity (σac) of amorphous films prepared by evaporation of TlInS₂ has been investigated at frequencies f = 5⋅10⁴…3.5⋅10⁷ Hz. It is shown that, at f > 10⁶ Hz, relaxation losses take place. It is established that the hopping...
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Дата: | 2007 |
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Автори: | , , |
Формат: | Стаття |
Мова: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2007
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Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/117916 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Frequency-dependent dielectric coefficients of TlInS₂ amorphous films / S.N. Mustafaeva, M.M. Asadov, K.Sh. Qahramanov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 58-61. — Бібліогр.: 11 назв. — англ. |
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irk-123456789-1179162017-05-28T03:04:06Z Frequency-dependent dielectric coefficients of TlInS₂ amorphous films Mustafaeva, S.N. Asadov, M.M. Qahramanov, K.Sh. The frequency dispersion of the loss tangent (tgδ) and the ac conductivity (σac) of amorphous films prepared by evaporation of TlInS₂ has been investigated at frequencies f = 5⋅10⁴…3.5⋅10⁷ Hz. It is shown that, at f > 10⁶ Hz, relaxation losses take place. It is established that the hopping conduction near the Fermi level occurs in TlInS₂ amorphous films at frequencies up to 3⋅10⁶ Hz. The density of localized states at the Fermi level, the mean time for phonon-assisted tunneling, and the hopping distance have been evaluated for polymorphic TlInS₂ films. For frequencies above 10⁷ Hz, σac( f ) ~ f₂. Such a behavior is caused by optical transitions in TlInS₂ amorphous films. 2007 Article Frequency-dependent dielectric coefficients of TlInS₂ amorphous films / S.N. Mustafaeva, M.M. Asadov, K.Sh. Qahramanov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 58-61. — Бібліогр.: 11 назв. — англ. 1560-8034 PACS 71.20.Nr; 71.23.Cq; 71.55.Jv; 72.20.Ee; 72.30.+q; 73.20.At; 73.20.Hb http://dspace.nbuv.gov.ua/handle/123456789/117916 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
collection |
DSpace DC |
language |
English |
description |
The frequency dispersion of the loss tangent (tgδ) and the ac conductivity (σac)
of amorphous films prepared by evaporation of TlInS₂ has been investigated at
frequencies f = 5⋅10⁴…3.5⋅10⁷ Hz. It is shown that, at f > 10⁶ Hz, relaxation losses take
place. It is established that the hopping conduction near the Fermi level occurs in TlInS₂
amorphous films at frequencies up to 3⋅10⁶ Hz. The density of localized states at the
Fermi level, the mean time for phonon-assisted tunneling, and the hopping distance have been evaluated for polymorphic TlInS₂ films. For frequencies above 10⁷ Hz, σac( f ) ~ f₂.
Such a behavior is caused by optical transitions in TlInS₂ amorphous films. |
format |
Article |
author |
Mustafaeva, S.N. Asadov, M.M. Qahramanov, K.Sh. |
spellingShingle |
Mustafaeva, S.N. Asadov, M.M. Qahramanov, K.Sh. Frequency-dependent dielectric coefficients of TlInS₂ amorphous films Semiconductor Physics Quantum Electronics & Optoelectronics |
author_facet |
Mustafaeva, S.N. Asadov, M.M. Qahramanov, K.Sh. |
author_sort |
Mustafaeva, S.N. |
title |
Frequency-dependent dielectric coefficients of TlInS₂ amorphous films |
title_short |
Frequency-dependent dielectric coefficients of TlInS₂ amorphous films |
title_full |
Frequency-dependent dielectric coefficients of TlInS₂ amorphous films |
title_fullStr |
Frequency-dependent dielectric coefficients of TlInS₂ amorphous films |
title_full_unstemmed |
Frequency-dependent dielectric coefficients of TlInS₂ amorphous films |
title_sort |
frequency-dependent dielectric coefficients of tlins₂ amorphous films |
publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
publishDate |
2007 |
url |
http://dspace.nbuv.gov.ua/handle/123456789/117916 |
citation_txt |
Frequency-dependent dielectric coefficients of TlInS₂ amorphous films / S.N. Mustafaeva, M.M. Asadov, K.Sh. Qahramanov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 58-61. — Бібліогр.: 11 назв. — англ. |
series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
work_keys_str_mv |
AT mustafaevasn frequencydependentdielectriccoefficientsoftlins2amorphousfilms AT asadovmm frequencydependentdielectriccoefficientsoftlins2amorphousfilms AT qahramanovksh frequencydependentdielectriccoefficientsoftlins2amorphousfilms |
first_indexed |
2023-10-18T20:30:54Z |
last_indexed |
2023-10-18T20:30:54Z |
_version_ |
1796150400980615168 |