Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics
The optical properties of multilayer structures consisting of dielectric, conductivity-oxide and nanoscaled metal layers, deposited on the planar substrates (witness samples) and surface relief ones (diffraction gratings) with micro- and nanoscale sizes, are investigated by AFM, spectral ellipsom...
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| Дата: | 2007 |
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| Автори: | , , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2007
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/117917 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics / N.L. Dmitruk, O.I. Mayeva, A.V. Korovin, S.V. Mamykin, M.V. Sosnova, O.B. Yastrubchak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 62-71. — Бібліогр.: 30 назв. — англ. |
Репозитарії
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irk-123456789-1179172017-05-28T03:04:01Z Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics Dmitruk, N.L. Mayeva, O.I. Korovin, A.V. Mamykin, S.V. Sosnova, M.V. Yastrubchak, O.B. The optical properties of multilayer structures consisting of dielectric, conductivity-oxide and nanoscaled metal layers, deposited on the planar substrates (witness samples) and surface relief ones (diffraction gratings) with micro- and nanoscale sizes, are investigated by AFM, spectral ellipsometry (SE), and photometric techniques. The SE-measured parameters are related to actual characteristics of the layers when specified the model of their near-surface regions. Using a parametrization of the layer dielectric function versus the wavelength and a fitting procedure, the dielectric parameters are determined. It is shown that the optical constants are affected by both the substrate morphology and the adjacent medium. Preliminary data about the influence of isolated particle plasmon excitations in 2D-substrates with the top nanoscaled Au layer on its optical properties are presented. 2007 Article Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics / N.L. Dmitruk, O.I. Mayeva, A.V. Korovin, S.V. Mamykin, M.V. Sosnova, O.B. Yastrubchak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 62-71. — Бібліогр.: 30 назв. — англ. 1560-8034 PACS 42.79.Dj, 71.36.+c,73.20.Mf http://dspace.nbuv.gov.ua/handle/123456789/117917 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
The optical properties of multilayer structures consisting of dielectric,
conductivity-oxide and nanoscaled metal layers, deposited on the planar substrates
(witness samples) and surface relief ones (diffraction gratings) with micro- and nanoscale
sizes, are investigated by AFM, spectral ellipsometry (SE), and photometric techniques.
The SE-measured parameters are related to actual characteristics of the layers when
specified the model of their near-surface regions. Using a parametrization of the layer
dielectric function versus the wavelength and a fitting procedure, the dielectric
parameters are determined. It is shown that the optical constants are affected by both the
substrate morphology and the adjacent medium. Preliminary data about the influence of
isolated particle plasmon excitations in 2D-substrates with the top nanoscaled Au layer
on its optical properties are presented. |
| format |
Article |
| author |
Dmitruk, N.L. Mayeva, O.I. Korovin, A.V. Mamykin, S.V. Sosnova, M.V. Yastrubchak, O.B. |
| spellingShingle |
Dmitruk, N.L. Mayeva, O.I. Korovin, A.V. Mamykin, S.V. Sosnova, M.V. Yastrubchak, O.B. Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Dmitruk, N.L. Mayeva, O.I. Korovin, A.V. Mamykin, S.V. Sosnova, M.V. Yastrubchak, O.B. |
| author_sort |
Dmitruk, N.L. |
| title |
Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics |
| title_short |
Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics |
| title_full |
Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics |
| title_fullStr |
Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics |
| title_full_unstemmed |
Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics |
| title_sort |
characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2007 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/117917 |
| citation_txt |
Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics / N.L. Dmitruk, O.I. Mayeva, A.V. Korovin, S.V. Mamykin, M.V. Sosnova, O.B. Yastrubchak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 62-71. — Бібліогр.: 30 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
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