The features of phonon component of linear dichroism in uniaxially strained silicon crystals

Linear dichroism induced by uniaxial compression strain in semiconductor silicon samples was studied with modulation spectroscopy technique using modulation of electromagnetic radiation polarization. We obtained a spectral characteristic of the difference between transmissions for polarizations para...

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Збережено в:
Бібліографічні деталі
Дата:2003
Автори: Serdega, B.K., Venger, E.F., Matyash, I.E.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/118038
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:The features of phonon component of linear dichroism in uniaxially strained silicon crystals / B.K. Serdega, E.F. Venger, I.E. Matyash // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 319-323. — Бібліогр.: 9 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
Опис
Резюме:Linear dichroism induced by uniaxial compression strain in semiconductor silicon samples was studied with modulation spectroscopy technique using modulation of electromagnetic radiation polarization. We obtained a spectral characteristic of the difference between transmissions for polarizations parallel to the different axes of the optical indicatrix of the sample studied in the edge absorption region. A fine structure of characteristics was found in which one can observe event of acoustic phonons in the interband transitions. From the results of measurements of the total and difference transmission characteristics we calculated spectral dependence of linear dichroism. It has singularities related to the indirect interband transitions.