Singular optics methods for analysis of spatial structure of diffraction field of optical elements
The paper is devoted to developing methods of analytical and experimental investigations of diffraction and interference phenomena used in test systems for optical elements. The theoretical analysis and experimental results illustrate the possibility of describing diffraction phenomena using the obj...
Збережено в:
| Дата: | 2003 |
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| Автори: | , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2003
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/118054 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Singular optics methods for analysis of spatial structure of diffraction field of optical elements / O.P. Budnyk, R.A. Lymarenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 417-422. — Бібліогр.: 13 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-118054 |
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irk-123456789-1180542017-05-29T03:04:35Z Singular optics methods for analysis of spatial structure of diffraction field of optical elements Budnyk, O.P. Lymarenko, R.A. The paper is devoted to developing methods of analytical and experimental investigations of diffraction and interference phenomena used in test systems for optical elements. The theoretical analysis and experimental results illustrate the possibility of describing diffraction phenomena using the objects and methods that were developed in singular optics. It was shown that a system of dislocations in singular component of diffraction field represents its topology. The diffracted field has a system of hidden optical vortices that are smoothly transformed during deformation of an aperture depending on boundary flexion. The proposed experimental proof ground can be useful for the analysis of a wavefront structure. It is also considered the technique for more accurate evaluation of Ronchi test results. The mathematical background of the Ronchi test technique is developed. It describes sufficiently well the wavefront shape, grating plate parameters, image sensor characteristics, parameters of image acquisition and restoration. The fringe pattern distributions and their spatial spectrum are calculated. Both the results of computer simulation of Ronchi fringe pattern and experimental ones obtained using image sensor and the applied image enhancement algorithms are shown. 2003 Article Singular optics methods for analysis of spatial structure of diffraction field of optical elements / O.P. Budnyk, R.A. Lymarenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 417-422. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS: 42.15.F, 42.25.F http://dspace.nbuv.gov.ua/handle/123456789/118054 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
The paper is devoted to developing methods of analytical and experimental investigations of diffraction and interference phenomena used in test systems for optical elements. The theoretical analysis and experimental results illustrate the possibility of describing diffraction phenomena using the objects and methods that were developed in singular optics. It was shown that a system of dislocations in singular component of diffraction field represents its topology. The diffracted field has a system of hidden optical vortices that are smoothly transformed during deformation of an aperture depending on boundary flexion. The proposed experimental proof ground can be useful for the analysis of a wavefront structure. It is also considered the technique for more accurate evaluation of Ronchi test results. The mathematical background of the Ronchi test technique is developed. It describes sufficiently well the wavefront shape, grating plate parameters, image sensor characteristics, parameters of image acquisition and restoration. The fringe pattern distributions and their spatial spectrum are calculated. Both the results of computer simulation of Ronchi fringe pattern and experimental ones obtained using image sensor and the applied image enhancement algorithms are shown. |
| format |
Article |
| author |
Budnyk, O.P. Lymarenko, R.A. |
| spellingShingle |
Budnyk, O.P. Lymarenko, R.A. Singular optics methods for analysis of spatial structure of diffraction field of optical elements Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Budnyk, O.P. Lymarenko, R.A. |
| author_sort |
Budnyk, O.P. |
| title |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements |
| title_short |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements |
| title_full |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements |
| title_fullStr |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements |
| title_full_unstemmed |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements |
| title_sort |
singular optics methods for analysis of spatial structure of diffraction field of optical elements |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2003 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/118054 |
| citation_txt |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements / O.P. Budnyk, R.A. Lymarenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 417-422. — Бібліогр.: 13 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| work_keys_str_mv |
AT budnykop singularopticsmethodsforanalysisofspatialstructureofdiffractionfieldofopticalelements AT lymarenkora singularopticsmethodsforanalysisofspatialstructureofdiffractionfieldofopticalelements |
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2023-10-18T20:31:14Z |
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2023-10-18T20:31:14Z |
| _version_ |
1796150415178334208 |