Metrological support of satellite-borne UV-spectrometry using a backscattering technique
Methods and physicotechnical facilities for examination, calibration and metrological testing of the main power spectral characteristics (total spectral sensitivity, scattered stray radiation, dynamic range) of the vehicle-borne ozone UV spectrometers in the spectral range 250-350 nm are considered.
Збережено в:
Дата: | 2004 |
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Автори: | , , |
Формат: | Стаття |
Мова: | English |
Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2004
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Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/118144 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Metrological support of satellite-borne UV-spectrometry using a backscattering technique / V. Vashchenko, Zh. Patlashenko, E. Chernysh // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 105-107. — Бібліогр.: 10 назв. — англ. |
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irk-123456789-1181442017-05-29T03:04:38Z Metrological support of satellite-borne UV-spectrometry using a backscattering technique Vashchenko, V. Patlashenko, Zh. Chernysh, E. Methods and physicotechnical facilities for examination, calibration and metrological testing of the main power spectral characteristics (total spectral sensitivity, scattered stray radiation, dynamic range) of the vehicle-borne ozone UV spectrometers in the spectral range 250-350 nm are considered. 2004 Article Metrological support of satellite-borne UV-spectrometry using a backscattering technique / V. Vashchenko, Zh. Patlashenko, E. Chernysh // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 105-107. — Бібліогр.: 10 назв. — англ. 1560-8034 PACS: 07.60.Rd http://dspace.nbuv.gov.ua/handle/123456789/118144 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
collection |
DSpace DC |
language |
English |
description |
Methods and physicotechnical facilities for examination, calibration and metrological testing of the main power spectral characteristics (total spectral sensitivity, scattered stray radiation, dynamic range) of the vehicle-borne ozone UV spectrometers in the spectral range 250-350 nm are considered. |
format |
Article |
author |
Vashchenko, V. Patlashenko, Zh. Chernysh, E. |
spellingShingle |
Vashchenko, V. Patlashenko, Zh. Chernysh, E. Metrological support of satellite-borne UV-spectrometry using a backscattering technique Semiconductor Physics Quantum Electronics & Optoelectronics |
author_facet |
Vashchenko, V. Patlashenko, Zh. Chernysh, E. |
author_sort |
Vashchenko, V. |
title |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique |
title_short |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique |
title_full |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique |
title_fullStr |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique |
title_full_unstemmed |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique |
title_sort |
metrological support of satellite-borne uv-spectrometry using a backscattering technique |
publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
publishDate |
2004 |
url |
http://dspace.nbuv.gov.ua/handle/123456789/118144 |
citation_txt |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique / V. Vashchenko, Zh. Patlashenko, E. Chernysh // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 105-107. — Бібліогр.: 10 назв. — англ. |
series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
work_keys_str_mv |
AT vashchenkov metrologicalsupportofsatelliteborneuvspectrometryusingabackscatteringtechnique AT patlashenkozh metrologicalsupportofsatelliteborneuvspectrometryusingabackscatteringtechnique AT chernyshe metrologicalsupportofsatelliteborneuvspectrometryusingabackscatteringtechnique |
first_indexed |
2023-10-18T20:31:26Z |
last_indexed |
2023-10-18T20:31:26Z |
_version_ |
1796150424813699072 |