Metrological support of satellite-borne UV-spectrometry using a backscattering technique

Methods and physicotechnical facilities for examination, calibration and metrological testing of the main power spectral characteristics (total spectral sensitivity, scattered stray radiation, dynamic range) of the vehicle-borne ozone UV spectrometers in the spectral range 250-350 nm are considered.

Збережено в:
Бібліографічні деталі
Дата:2004
Автори: Vashchenko, V., Patlashenko, Zh., Chernysh, E.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2004
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/118144
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Metrological support of satellite-borne UV-spectrometry using a backscattering technique / V. Vashchenko, Zh. Patlashenko, E. Chernysh // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 105-107. — Бібліогр.: 10 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1181442017-05-29T03:04:38Z Metrological support of satellite-borne UV-spectrometry using a backscattering technique Vashchenko, V. Patlashenko, Zh. Chernysh, E. Methods and physicotechnical facilities for examination, calibration and metrological testing of the main power spectral characteristics (total spectral sensitivity, scattered stray radiation, dynamic range) of the vehicle-borne ozone UV spectrometers in the spectral range 250-350 nm are considered. 2004 Article Metrological support of satellite-borne UV-spectrometry using a backscattering technique / V. Vashchenko, Zh. Patlashenko, E. Chernysh // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 105-107. — Бібліогр.: 10 назв. — англ. 1560-8034 PACS: 07.60.Rd http://dspace.nbuv.gov.ua/handle/123456789/118144 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description Methods and physicotechnical facilities for examination, calibration and metrological testing of the main power spectral characteristics (total spectral sensitivity, scattered stray radiation, dynamic range) of the vehicle-borne ozone UV spectrometers in the spectral range 250-350 nm are considered.
format Article
author Vashchenko, V.
Patlashenko, Zh.
Chernysh, E.
spellingShingle Vashchenko, V.
Patlashenko, Zh.
Chernysh, E.
Metrological support of satellite-borne UV-spectrometry using a backscattering technique
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Vashchenko, V.
Patlashenko, Zh.
Chernysh, E.
author_sort Vashchenko, V.
title Metrological support of satellite-borne UV-spectrometry using a backscattering technique
title_short Metrological support of satellite-borne UV-spectrometry using a backscattering technique
title_full Metrological support of satellite-borne UV-spectrometry using a backscattering technique
title_fullStr Metrological support of satellite-borne UV-spectrometry using a backscattering technique
title_full_unstemmed Metrological support of satellite-borne UV-spectrometry using a backscattering technique
title_sort metrological support of satellite-borne uv-spectrometry using a backscattering technique
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2004
url http://dspace.nbuv.gov.ua/handle/123456789/118144
citation_txt Metrological support of satellite-borne UV-spectrometry using a backscattering technique / V. Vashchenko, Zh. Patlashenko, E. Chernysh // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 105-107. — Бібліогр.: 10 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT vashchenkov metrologicalsupportofsatelliteborneuvspectrometryusingabackscatteringtechnique
AT patlashenkozh metrologicalsupportofsatelliteborneuvspectrometryusingabackscatteringtechnique
AT chernyshe metrologicalsupportofsatelliteborneuvspectrometryusingabackscatteringtechnique
first_indexed 2023-10-18T20:31:26Z
last_indexed 2023-10-18T20:31:26Z
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