Features of Auger-emission in channeling

Shown in this paper is the influence of channeling effect on formation of the signal for low- and high-energy Auger-electrons observed in monocrystalline silicon. It has been ascertained the anisotropic (wave-like) character of the yield value for lowenergy Auger-electrons in silicon, when changi...

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Бібліографічні деталі
Дата:2014
Автори: Kossko, I.A., Denisov, A.Ye.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/118361
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Features of Auger-emission in channeling / I.A. Kossko, A.Ye. Denisov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 97-99. — Бібліогр.: 6 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1183612017-05-31T03:04:44Z Features of Auger-emission in channeling Kossko, I.A. Denisov, A.Ye. Shown in this paper is the influence of channeling effect on formation of the signal for low- and high-energy Auger-electrons observed in monocrystalline silicon. It has been ascertained the anisotropic (wave-like) character of the yield value for lowenergy Auger-electrons in silicon, when changing the angle of acting initial radiation during sample rotation. 2014 Article Features of Auger-emission in channeling / I.A. Kossko, A.Ye. Denisov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 97-99. — Бібліогр.: 6 назв. — англ. 1560-8034 Features of Auger-emission in channeling http://dspace.nbuv.gov.ua/handle/123456789/118361 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description Shown in this paper is the influence of channeling effect on formation of the signal for low- and high-energy Auger-electrons observed in monocrystalline silicon. It has been ascertained the anisotropic (wave-like) character of the yield value for lowenergy Auger-electrons in silicon, when changing the angle of acting initial radiation during sample rotation.
format Article
author Kossko, I.A.
Denisov, A.Ye.
spellingShingle Kossko, I.A.
Denisov, A.Ye.
Features of Auger-emission in channeling
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Kossko, I.A.
Denisov, A.Ye.
author_sort Kossko, I.A.
title Features of Auger-emission in channeling
title_short Features of Auger-emission in channeling
title_full Features of Auger-emission in channeling
title_fullStr Features of Auger-emission in channeling
title_full_unstemmed Features of Auger-emission in channeling
title_sort features of auger-emission in channeling
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2014
url http://dspace.nbuv.gov.ua/handle/123456789/118361
citation_txt Features of Auger-emission in channeling / I.A. Kossko, A.Ye. Denisov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 97-99. — Бібліогр.: 6 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT kosskoia featuresofaugeremissioninchanneling
AT denisovaye featuresofaugeremissioninchanneling
first_indexed 2023-10-18T20:31:48Z
last_indexed 2023-10-18T20:31:48Z
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