Features of Auger-emission in channeling
Shown in this paper is the influence of channeling effect on formation of the signal for low- and high-energy Auger-electrons observed in monocrystalline silicon. It has been ascertained the anisotropic (wave-like) character of the yield value for lowenergy Auger-electrons in silicon, when changi...
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Дата: | 2014 |
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Автори: | , |
Формат: | Стаття |
Мова: | English |
Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2014
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Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/118361 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Features of Auger-emission in channeling / I.A. Kossko, A.Ye. Denisov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 97-99. — Бібліогр.: 6 назв. — англ. |
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irk-123456789-1183612017-05-31T03:04:44Z Features of Auger-emission in channeling Kossko, I.A. Denisov, A.Ye. Shown in this paper is the influence of channeling effect on formation of the signal for low- and high-energy Auger-electrons observed in monocrystalline silicon. It has been ascertained the anisotropic (wave-like) character of the yield value for lowenergy Auger-electrons in silicon, when changing the angle of acting initial radiation during sample rotation. 2014 Article Features of Auger-emission in channeling / I.A. Kossko, A.Ye. Denisov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 97-99. — Бібліогр.: 6 назв. — англ. 1560-8034 Features of Auger-emission in channeling http://dspace.nbuv.gov.ua/handle/123456789/118361 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
collection |
DSpace DC |
language |
English |
description |
Shown in this paper is the influence of channeling effect on formation of the
signal for low- and high-energy Auger-electrons observed in monocrystalline silicon. It
has been ascertained the anisotropic (wave-like) character of the yield value for lowenergy
Auger-electrons in silicon, when changing the angle of acting initial radiation
during sample rotation. |
format |
Article |
author |
Kossko, I.A. Denisov, A.Ye. |
spellingShingle |
Kossko, I.A. Denisov, A.Ye. Features of Auger-emission in channeling Semiconductor Physics Quantum Electronics & Optoelectronics |
author_facet |
Kossko, I.A. Denisov, A.Ye. |
author_sort |
Kossko, I.A. |
title |
Features of Auger-emission in channeling |
title_short |
Features of Auger-emission in channeling |
title_full |
Features of Auger-emission in channeling |
title_fullStr |
Features of Auger-emission in channeling |
title_full_unstemmed |
Features of Auger-emission in channeling |
title_sort |
features of auger-emission in channeling |
publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
publishDate |
2014 |
url |
http://dspace.nbuv.gov.ua/handle/123456789/118361 |
citation_txt |
Features of Auger-emission in channeling / I.A. Kossko, A.Ye. Denisov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 97-99. — Бібліогр.: 6 назв. — англ. |
series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
work_keys_str_mv |
AT kosskoia featuresofaugeremissioninchanneling AT denisovaye featuresofaugeremissioninchanneling |
first_indexed |
2023-10-18T20:31:48Z |
last_indexed |
2023-10-18T20:31:48Z |
_version_ |
1796150444014174208 |