Calculated images of dislocations in crystals on section topograms
By means of numerical solution of the Takagi equations, modeling of X-ray topographic images of deformation fields of the dislocation loops and dislocation of different types. Diffraction images created by dislocations and dislocation loops of different size and spatial location are complicated a...
Збережено в:
| Дата: | 2010 |
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| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2010
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/118401 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Calculated images of dislocations in crystals on section topograms / S.M. Novіkov, І.M. Fodchuk, D.G. Fedortsov, A.Ya. Struk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 268-272. — Бібліогр.: 19 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | By means of numerical solution of the Takagi equations, modeling of X-ray
topographic images of deformation fields of the dislocation loops and dislocation of
different types. Diffraction images created by dislocations and dislocation loops of
different size and spatial location are complicated and versatile in their thin structure. |
|---|