The electrical resistance of spatially varied magnetic interface. The role of normal scattering

We investigate the diffusive electron transport in conductors with spatially inhomogeneous magnetic properties taking into account both impurity and normal scattering. It is found that the additional interface resistance that arises due to the magnetic inhomogeneity depends essentially on their spat...

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Дата:2011
Автори: Gurzhi, R.N., Kalinenko, A.N., Kopeliovich, A.I., Pyshkin, P.V., Yanovsky, A.V.
Формат: Стаття
Мова:Russian
Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2011
Назва видання:Физика низких температур
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Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/118493
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:The electrical resistance of spatially varied magnetic interface. The role of normal scattering / R.N. Gurzhi, A.N. Kalinenko, A.I. Kopeliovich, P.V. Pyshkin, A.V. Yanovsky // Физика низких температур. — 2011. — Т. 37, № 2. — С. 186–194. — Бібліогр.: 13 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-118493
record_format dspace
spelling irk-123456789-1184932017-05-31T03:08:56Z The electrical resistance of spatially varied magnetic interface. The role of normal scattering Gurzhi, R.N. Kalinenko, A.N. Kopeliovich, A.I. Pyshkin, P.V. Yanovsky, A.V. Электронные свойства проводящих систем We investigate the diffusive electron transport in conductors with spatially inhomogeneous magnetic properties taking into account both impurity and normal scattering. It is found that the additional interface resistance that arises due to the magnetic inhomogeneity depends essentially on their spatial characteristics. The resistance is proportional to the spin flip time in the case when the magnetic properties of the conducting system vary smoothly enough along the sample. It can be used to direct experimental investigation of spin flip processes. In the opposite case, when magnetic characteristics are varied sharply, the additional resistance depends essentially on the difference of magnetic properties of the sides far from the interface region. The resistance increases as the frequency of the electron-electron scattering increases. We consider also two types of smooth interfaces: (i) between fully spin-polarized magnetics and usual magnetic (or non-magnetic) conductors, and (ii) between two fully oppositely polarized magnetic conductors. It is shown that the interface resistance is very sensitive to appearing of the fully spin-polarized state under the applied external field. 2011 Article The electrical resistance of spatially varied magnetic interface. The role of normal scattering / R.N. Gurzhi, A.N. Kalinenko, A.I. Kopeliovich, P.V. Pyshkin, A.V. Yanovsky // Физика низких температур. — 2011. — Т. 37, № 2. — С. 186–194. — Бібліогр.: 13 назв. — англ. 0132-6414 PACS: 72.25.Mk, 73.40.Cg http://dspace.nbuv.gov.ua/handle/123456789/118493 ru Физика низких температур Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language Russian
topic Электронные свойства проводящих систем
Электронные свойства проводящих систем
spellingShingle Электронные свойства проводящих систем
Электронные свойства проводящих систем
Gurzhi, R.N.
Kalinenko, A.N.
Kopeliovich, A.I.
Pyshkin, P.V.
Yanovsky, A.V.
The electrical resistance of spatially varied magnetic interface. The role of normal scattering
Физика низких температур
description We investigate the diffusive electron transport in conductors with spatially inhomogeneous magnetic properties taking into account both impurity and normal scattering. It is found that the additional interface resistance that arises due to the magnetic inhomogeneity depends essentially on their spatial characteristics. The resistance is proportional to the spin flip time in the case when the magnetic properties of the conducting system vary smoothly enough along the sample. It can be used to direct experimental investigation of spin flip processes. In the opposite case, when magnetic characteristics are varied sharply, the additional resistance depends essentially on the difference of magnetic properties of the sides far from the interface region. The resistance increases as the frequency of the electron-electron scattering increases. We consider also two types of smooth interfaces: (i) between fully spin-polarized magnetics and usual magnetic (or non-magnetic) conductors, and (ii) between two fully oppositely polarized magnetic conductors. It is shown that the interface resistance is very sensitive to appearing of the fully spin-polarized state under the applied external field.
format Article
author Gurzhi, R.N.
Kalinenko, A.N.
Kopeliovich, A.I.
Pyshkin, P.V.
Yanovsky, A.V.
author_facet Gurzhi, R.N.
Kalinenko, A.N.
Kopeliovich, A.I.
Pyshkin, P.V.
Yanovsky, A.V.
author_sort Gurzhi, R.N.
title The electrical resistance of spatially varied magnetic interface. The role of normal scattering
title_short The electrical resistance of spatially varied magnetic interface. The role of normal scattering
title_full The electrical resistance of spatially varied magnetic interface. The role of normal scattering
title_fullStr The electrical resistance of spatially varied magnetic interface. The role of normal scattering
title_full_unstemmed The electrical resistance of spatially varied magnetic interface. The role of normal scattering
title_sort electrical resistance of spatially varied magnetic interface. the role of normal scattering
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
publishDate 2011
topic_facet Электронные свойства проводящих систем
url http://dspace.nbuv.gov.ua/handle/123456789/118493
citation_txt The electrical resistance of spatially varied magnetic interface. The role of normal scattering / R.N. Gurzhi, A.N. Kalinenko, A.I. Kopeliovich, P.V. Pyshkin, A.V. Yanovsky // Физика низких температур. — 2011. — Т. 37, № 2. — С. 186–194. — Бібліогр.: 13 назв. — англ.
series Физика низких температур
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first_indexed 2023-10-18T20:32:23Z
last_indexed 2023-10-18T20:32:23Z
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