Reliability of AC thick-film electroluminescent lamps
The reliability of AC thick-film EL devices has been studied. The AC thickfilm EL devices were fabricated by Novatech Inc. using the industrial print screen technology. The analysis of reasons for failure has been proposed. The dependence of EL lamp parameters on physical properties of the device...
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| Дата: | 2009 |
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| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2009
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/118690 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Reliability of AC thick-film electroluminescent lamps / V. Vlaskin, S. Vlaskina, L. Berezhinsky, G. Svyechnikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 2. — С. 173-177. — Бібліогр.: 5 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-118690 |
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dspace |
| spelling |
irk-123456789-1186902017-05-31T03:10:11Z Reliability of AC thick-film electroluminescent lamps Vlaskin, V. Vlaskina, S. Berezhinsky, L. Svechnikov, G. The reliability of AC thick-film EL devices has been studied. The AC thickfilm EL devices were fabricated by Novatech Inc. using the industrial print screen technology. The analysis of reasons for failure has been proposed. The dependence of EL lamp parameters on physical properties of the device EL layers was found. Our analysis of the breakdown spot showed that improvement of reliability can be reached using the additional dielectric layer between the phosphor layer and transparent electrode, high concentration of phosphor powder 70 % and binder 30 %, balanced resistance between the electric circuit and EL lamp. The thickness of the phosphor layer was equal to H = (1 + √3/2)D (hexagonal packing), where D is the mean diameter of phosphor particles. The reliability dependence of EL lamp on a water adsorption property of packaging material was revealed. 2009 Article Reliability of AC thick-film electroluminescent lamps / V. Vlaskin, S. Vlaskina, L. Berezhinsky, G. Svyechnikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 2. — С. 173-177. — Бібліогр.: 5 назв. — англ. 1560-8034 PACS 78.60.Fi http://dspace.nbuv.gov.ua/handle/123456789/118690 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
The reliability of AC thick-film EL devices has been studied. The AC thickfilm
EL devices were fabricated by Novatech Inc. using the industrial print screen
technology. The analysis of reasons for failure has been proposed. The dependence of EL
lamp parameters on physical properties of the device EL layers was found. Our analysis
of the breakdown spot showed that improvement of reliability can be reached using the
additional dielectric layer between the phosphor layer and transparent electrode, high
concentration of phosphor powder 70 % and binder 30 %, balanced resistance between
the electric circuit and EL lamp. The thickness of the phosphor layer was equal to H =
(1 + √3/2)D (hexagonal packing), where D is the mean diameter of phosphor particles.
The reliability dependence of EL lamp on a water adsorption property of packaging
material was revealed. |
| format |
Article |
| author |
Vlaskin, V. Vlaskina, S. Berezhinsky, L. Svechnikov, G. |
| spellingShingle |
Vlaskin, V. Vlaskina, S. Berezhinsky, L. Svechnikov, G. Reliability of AC thick-film electroluminescent lamps Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Vlaskin, V. Vlaskina, S. Berezhinsky, L. Svechnikov, G. |
| author_sort |
Vlaskin, V. |
| title |
Reliability of AC thick-film electroluminescent lamps |
| title_short |
Reliability of AC thick-film electroluminescent lamps |
| title_full |
Reliability of AC thick-film electroluminescent lamps |
| title_fullStr |
Reliability of AC thick-film electroluminescent lamps |
| title_full_unstemmed |
Reliability of AC thick-film electroluminescent lamps |
| title_sort |
reliability of ac thick-film electroluminescent lamps |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2009 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/118690 |
| citation_txt |
Reliability of AC thick-film electroluminescent lamps / V. Vlaskin, S. Vlaskina, L. Berezhinsky, G. Svyechnikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 2. — С. 173-177. — Бібліогр.: 5 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
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| first_indexed |
2023-10-18T20:32:52Z |
| last_indexed |
2023-10-18T20:32:52Z |
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