X-ray dosimetry of copper-doped CdGa₂S₄ single crystals

Comparative analysis of the X-ray dosimetric characteristics of CdGa₂S₄ and CdGa₂S₄<Cu> single crystals demonstrates that after copper-doping the persistence of the crystal characteristics completely disappears. The current-dose characteristics Ir ~ E tend to linearity (α = 1) at low dos...

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Дата:2012
Автори: Mustafaeva, S.N., Asadov, M.M., Guseinov, D.T.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2012
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/118727
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:X-ray dosimetry of copper-doped CdGa₂S₄ single crystals / S.N. Mustafaeva, M.M. Asadov, D.T. Guseinov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 358-359. — Бібліогр.: 4 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-118727
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spelling irk-123456789-1187272017-06-01T03:05:10Z X-ray dosimetry of copper-doped CdGa₂S₄ single crystals Mustafaeva, S.N. Asadov, M.M. Guseinov, D.T. Comparative analysis of the X-ray dosimetric characteristics of CdGa₂S₄ and CdGa₂S₄<Cu> single crystals demonstrates that after copper-doping the persistence of the crystal characteristics completely disappears. The current-dose characteristics Ir ~ E tend to linearity (α = 1) at low dose rates of X-rays. At high dose rates, α tends to 0.5, which testifies to the mechanism of quadratic recombination of charge carriers generated by X-rays in CdGa₂S₄<Cu>. 2012 Article X-ray dosimetry of copper-doped CdGa₂S₄ single crystals / S.N. Mustafaeva, M.M. Asadov, D.T. Guseinov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 358-359. — Бібліогр.: 4 назв. — англ. 1560-8034 http://dspace.nbuv.gov.ua/handle/123456789/118727 PACS 71.20.Nr, 72.15.Cz, 72.20.Jv, 72.80.Jc en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description Comparative analysis of the X-ray dosimetric characteristics of CdGa₂S₄ and CdGa₂S₄<Cu> single crystals demonstrates that after copper-doping the persistence of the crystal characteristics completely disappears. The current-dose characteristics Ir ~ E tend to linearity (α = 1) at low dose rates of X-rays. At high dose rates, α tends to 0.5, which testifies to the mechanism of quadratic recombination of charge carriers generated by X-rays in CdGa₂S₄<Cu>.
format Article
author Mustafaeva, S.N.
Asadov, M.M.
Guseinov, D.T.
spellingShingle Mustafaeva, S.N.
Asadov, M.M.
Guseinov, D.T.
X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Mustafaeva, S.N.
Asadov, M.M.
Guseinov, D.T.
author_sort Mustafaeva, S.N.
title X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
title_short X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
title_full X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
title_fullStr X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
title_full_unstemmed X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
title_sort x-ray dosimetry of copper-doped cdga₂s₄ single crystals
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2012
url http://dspace.nbuv.gov.ua/handle/123456789/118727
citation_txt X-ray dosimetry of copper-doped CdGa₂S₄ single crystals / S.N. Mustafaeva, M.M. Asadov, D.T. Guseinov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 358-359. — Бібліогр.: 4 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
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AT asadovmm xraydosimetryofcopperdopedcdga2s4singlecrystals
AT guseinovdt xraydosimetryofcopperdopedcdga2s4singlecrystals
first_indexed 2023-10-18T20:32:16Z
last_indexed 2023-10-18T20:32:16Z
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