Stimulated emission of Cr²⁺ ions in ZnS:Cr thin-film electroluminescent structures

First observation of stimulated Cr²⁺ emission in ZnS:Cr electroluminescent (EL) impact-excited thin-film waveguide structures is reported. The structures consist of the following thin films deposited on a glass substrate: a transparent In₂O₃:Sn electrode, an insulator SiO₂/Al₂O₃ layer (~270 nm),...

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Дата:2009
Автори: Vlasenko, N.A., Oleksenko, P.F., Mukhlyo, M.A., Veligura, L.I., Denisova, Z.L.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2009
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/118837
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Stimulated emission of Cr²⁺ ions in ZnS:Cr thin-film electroluminescent structures / N.A. Vlasenko, P.F. Oleksenko, M.A. Mukhlyo, L.I. Veligura, and Z.L. Denisova // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 4. — С. 362-365. — Бібліогр.: 9 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1188372017-06-01T03:06:10Z Stimulated emission of Cr²⁺ ions in ZnS:Cr thin-film electroluminescent structures Vlasenko, N.A. Oleksenko, P.F. Mukhlyo, M.A. Veligura, L.I. Denisova, Z.L. First observation of stimulated Cr²⁺ emission in ZnS:Cr electroluminescent (EL) impact-excited thin-film waveguide structures is reported. The structures consist of the following thin films deposited on a glass substrate: a transparent In₂O₃:Sn electrode, an insulator SiO₂/Al₂O₃ layer (~270 nm), an EL ZnS:Cr film (~600 nm), the same insulator layer, and an Al electrode. The stimulated character of the emission recorded through the edge of the structure is evidenced by the following. With increasing the applied voltage, a broad band with three waveguide mode maxima in the edge emission spectrum changes into an intensifying and narrowing band. The maximum of this band is the same as that of the Cr²⁺ emission band recorded through the face, i.e. through the In₂O₃:Sn electrode (1.75 and ~2.6 µm at the Cr concentrations (5-7)*10¹⁹ and (2- 3)*10²⁰ cm⁻³, respectively). The five-fold narrowing is observed when increasing the voltage by ~4% in the case of the lower Cr concentration. The voltage and frequency dependences of the edge emission are stronger than those for the face emission. A small manifestation of the gain occurrence in the ZnS:Cr TFELS is also observed in the face emission. The possibility to create a new type of electrically pumped lasers with the impact excitation mechanism is discussed. 2009 Article Stimulated emission of Cr²⁺ ions in ZnS:Cr thin-film electroluminescent structures / N.A. Vlasenko, P.F. Oleksenko, M.A. Mukhlyo, L.I. Veligura, and Z.L. Denisova // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 4. — С. 362-365. — Бібліогр.: 9 назв. — англ. 1560-8034 PACS 78.45.+h, 78.60.Fi http://dspace.nbuv.gov.ua/handle/123456789/118837 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description First observation of stimulated Cr²⁺ emission in ZnS:Cr electroluminescent (EL) impact-excited thin-film waveguide structures is reported. The structures consist of the following thin films deposited on a glass substrate: a transparent In₂O₃:Sn electrode, an insulator SiO₂/Al₂O₃ layer (~270 nm), an EL ZnS:Cr film (~600 nm), the same insulator layer, and an Al electrode. The stimulated character of the emission recorded through the edge of the structure is evidenced by the following. With increasing the applied voltage, a broad band with three waveguide mode maxima in the edge emission spectrum changes into an intensifying and narrowing band. The maximum of this band is the same as that of the Cr²⁺ emission band recorded through the face, i.e. through the In₂O₃:Sn electrode (1.75 and ~2.6 µm at the Cr concentrations (5-7)*10¹⁹ and (2- 3)*10²⁰ cm⁻³, respectively). The five-fold narrowing is observed when increasing the voltage by ~4% in the case of the lower Cr concentration. The voltage and frequency dependences of the edge emission are stronger than those for the face emission. A small manifestation of the gain occurrence in the ZnS:Cr TFELS is also observed in the face emission. The possibility to create a new type of electrically pumped lasers with the impact excitation mechanism is discussed.
format Article
author Vlasenko, N.A.
Oleksenko, P.F.
Mukhlyo, M.A.
Veligura, L.I.
Denisova, Z.L.
spellingShingle Vlasenko, N.A.
Oleksenko, P.F.
Mukhlyo, M.A.
Veligura, L.I.
Denisova, Z.L.
Stimulated emission of Cr²⁺ ions in ZnS:Cr thin-film electroluminescent structures
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Vlasenko, N.A.
Oleksenko, P.F.
Mukhlyo, M.A.
Veligura, L.I.
Denisova, Z.L.
author_sort Vlasenko, N.A.
title Stimulated emission of Cr²⁺ ions in ZnS:Cr thin-film electroluminescent structures
title_short Stimulated emission of Cr²⁺ ions in ZnS:Cr thin-film electroluminescent structures
title_full Stimulated emission of Cr²⁺ ions in ZnS:Cr thin-film electroluminescent structures
title_fullStr Stimulated emission of Cr²⁺ ions in ZnS:Cr thin-film electroluminescent structures
title_full_unstemmed Stimulated emission of Cr²⁺ ions in ZnS:Cr thin-film electroluminescent structures
title_sort stimulated emission of cr²⁺ ions in zns:cr thin-film electroluminescent structures
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2009
url http://dspace.nbuv.gov.ua/handle/123456789/118837
citation_txt Stimulated emission of Cr²⁺ ions in ZnS:Cr thin-film electroluminescent structures / N.A. Vlasenko, P.F. Oleksenko, M.A. Mukhlyo, L.I. Veligura, and Z.L. Denisova // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 4. — С. 362-365. — Бібліогр.: 9 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
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last_indexed 2023-10-18T20:33:07Z
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