Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector

. Bragg reflectors consisting of sequence of dielectric layers with a quarter wavelengths optical thickness are promising to create solar cells of third generation. SiОх /SiNx Bragg mirror (BM) at the backside of textured multicrystalline silicon solar cells was fabricated by PECVD method. BM wit...

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Бібліографічні деталі
Дата:2009
Автори: Ivanov, I.I., Nychyporuk, T.V., Skryshevsky, V.A., Lemiti, M.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2009
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/118845
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector / I.I. Ivanov, T.V. Nychyporuk, V.A. Skryshevsky, M. Lemiti // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 4. — С. 406-411. — Бібліогр.: 9 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1188452017-06-01T03:06:47Z Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector Ivanov, I.I. Nychyporuk, T.V. Skryshevsky, V.A. Lemiti, M. . Bragg reflectors consisting of sequence of dielectric layers with a quarter wavelengths optical thickness are promising to create solar cells of third generation. SiОх /SiNx Bragg mirror (BM) at the backside of textured multicrystalline silicon solar cells was fabricated by PECVD method. BM with 9 bi-layers was optimized for the maximum reflectivity within the wavelength range Δλ = 820...1110 nm. The maximum measured reflectivity is approximately 82 %. Measured reflectivity values were compared with the simulated ones by using the transfer matrix. Effect of parameters for pyramids of several types on the total reflectivity of BM deposited on textured silicon surface was simulated. Enhancement of light absorption and external quantum efficiency in the longwave part of the spectrum (λ > 940 nm) was observed, and it was explained as increase of the photon absorption length. The influence of BM on passivation of SC rear surface was explored. The cell back contact was formed by Al diffusion through BM to the μc-Si wafer and promoted by a pulsed laser. For SC with BM, the efficiency 13.75 % is obtained comparatively with efficiency 13.58 % for SC without BM. 2009 Article Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector / I.I. Ivanov, T.V. Nychyporuk, V.A. Skryshevsky, M. Lemiti // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 4. — С. 406-411. — Бібліогр.: 9 назв. — англ. 1560-8034 PACS 42.79.Bh, 78.66.Db, 84.60.Jt http://dspace.nbuv.gov.ua/handle/123456789/118845 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description . Bragg reflectors consisting of sequence of dielectric layers with a quarter wavelengths optical thickness are promising to create solar cells of third generation. SiОх /SiNx Bragg mirror (BM) at the backside of textured multicrystalline silicon solar cells was fabricated by PECVD method. BM with 9 bi-layers was optimized for the maximum reflectivity within the wavelength range Δλ = 820...1110 nm. The maximum measured reflectivity is approximately 82 %. Measured reflectivity values were compared with the simulated ones by using the transfer matrix. Effect of parameters for pyramids of several types on the total reflectivity of BM deposited on textured silicon surface was simulated. Enhancement of light absorption and external quantum efficiency in the longwave part of the spectrum (λ > 940 nm) was observed, and it was explained as increase of the photon absorption length. The influence of BM on passivation of SC rear surface was explored. The cell back contact was formed by Al diffusion through BM to the μc-Si wafer and promoted by a pulsed laser. For SC with BM, the efficiency 13.75 % is obtained comparatively with efficiency 13.58 % for SC without BM.
format Article
author Ivanov, I.I.
Nychyporuk, T.V.
Skryshevsky, V.A.
Lemiti, M.
spellingShingle Ivanov, I.I.
Nychyporuk, T.V.
Skryshevsky, V.A.
Lemiti, M.
Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Ivanov, I.I.
Nychyporuk, T.V.
Skryshevsky, V.A.
Lemiti, M.
author_sort Ivanov, I.I.
title Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector
title_short Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector
title_full Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector
title_fullStr Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector
title_full_unstemmed Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector
title_sort thin silicon solar cells with siох /sinx bragg mirror rear surface reflector
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2009
url http://dspace.nbuv.gov.ua/handle/123456789/118845
citation_txt Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector / I.I. Ivanov, T.V. Nychyporuk, V.A. Skryshevsky, M. Lemiti // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 4. — С. 406-411. — Бібліогр.: 9 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
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AT skryshevskyva thinsiliconsolarcellswithsiohsinxbraggmirrorrearsurfacereflector
AT lemitim thinsiliconsolarcellswithsiohsinxbraggmirrorrearsurfacereflector
first_indexed 2023-10-18T20:33:08Z
last_indexed 2023-10-18T20:33:08Z
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