Effect of the structure of polarimeter characteristic matrix on light polarization measurements
In the paper, we carried out the comparative analysis of three polarimeters among the most usable their variants: (i) Stokes polarimeter based on phenomenological definition of Stokes parameters; (ii) Stokes polarimeter based on the method of four intensities; (iii) Stokes dynamic polarimeter. We...
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| Видавець: | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
|---|---|
| Дата: | 2009 |
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2009
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/118872 |
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| Цитувати: | Effect of the structure of polarimeter characteristic matrix on light polarization measurements / S.N. Savenkov, Ye.A. Oberemok, O.S. Klimov, О.I. Barchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 3. — С.264-271. — Бібліогр.: 26 назв. — англ. |
Репозиторії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-118872 |
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dspace |
| spelling |
irk-123456789-1188722017-06-01T03:05:14Z Effect of the structure of polarimeter characteristic matrix on light polarization measurements Savenkov, S.N. Oberemok, Ye.A. Klimov, O.S. Barchuk, О.I. In the paper, we carried out the comparative analysis of three polarimeters among the most usable their variants: (i) Stokes polarimeter based on phenomenological definition of Stokes parameters; (ii) Stokes polarimeter based on the method of four intensities; (iii) Stokes dynamic polarimeter. We show that, since the accuracy in determination of individual Stokes parameter is different for different types of polarimeters, and, therewith, it depends on polarization of input light. All that strongly motivates the choice of type of polarimeter to provide minimum errors in determination of polarization parameters (ellipticity angle ε, azimuth β, and degree of polarization P). 2009 Article Effect of the structure of polarimeter characteristic matrix on light polarization measurements / S.N. Savenkov, Ye.A. Oberemok, O.S. Klimov, О.I. Barchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 3. — С.264-271. — Бібліогр.: 26 назв. — англ. 1560-8034 PACS 07.60.Fs http://dspace.nbuv.gov.ua/handle/123456789/118872 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
In the paper, we carried out the comparative analysis of three polarimeters
among the most usable their variants: (i) Stokes polarimeter based on phenomenological
definition of Stokes parameters; (ii) Stokes polarimeter based on the method of four
intensities; (iii) Stokes dynamic polarimeter. We show that, since the accuracy in
determination of individual Stokes parameter is different for different types of
polarimeters, and, therewith, it depends on polarization of input light. All that strongly
motivates the choice of type of polarimeter to provide minimum errors in determination
of polarization parameters (ellipticity angle ε, azimuth β, and degree of polarization P). |
| format |
Article |
| author |
Savenkov, S.N. Oberemok, Ye.A. Klimov, O.S. Barchuk, О.I. |
| spellingShingle |
Savenkov, S.N. Oberemok, Ye.A. Klimov, O.S. Barchuk, О.I. Effect of the structure of polarimeter characteristic matrix on light polarization measurements Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Savenkov, S.N. Oberemok, Ye.A. Klimov, O.S. Barchuk, О.I. |
| author_sort |
Savenkov, S.N. |
| title |
Effect of the structure of polarimeter characteristic matrix on light polarization measurements |
| title_short |
Effect of the structure of polarimeter characteristic matrix on light polarization measurements |
| title_full |
Effect of the structure of polarimeter characteristic matrix on light polarization measurements |
| title_fullStr |
Effect of the structure of polarimeter characteristic matrix on light polarization measurements |
| title_full_unstemmed |
Effect of the structure of polarimeter characteristic matrix on light polarization measurements |
| title_sort |
effect of the structure of polarimeter characteristic matrix on light polarization measurements |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2009 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/118872 |
| citation_txt |
Effect of the structure of polarimeter characteristic matrix
on light polarization measurements / S.N. Savenkov, Ye.A. Oberemok, O.S. Klimov, О.I. Barchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 3. — С.264-271. — Бібліогр.: 26 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| work_keys_str_mv |
AT savenkovsn effectofthestructureofpolarimetercharacteristicmatrixonlightpolarizationmeasurements AT oberemokyea effectofthestructureofpolarimetercharacteristicmatrixonlightpolarizationmeasurements AT klimovos effectofthestructureofpolarimetercharacteristicmatrixonlightpolarizationmeasurements AT barchukoi effectofthestructureofpolarimetercharacteristicmatrixonlightpolarizationmeasurements |
| first_indexed |
2023-10-18T20:33:12Z |
| last_indexed |
2023-10-18T20:33:12Z |
| _version_ |
1796150496925319168 |