Effect of the structure of polarimeter characteristic matrix on light polarization measurements

In the paper, we carried out the comparative analysis of three polarimeters among the most usable their variants: (i) Stokes polarimeter based on phenomenological definition of Stokes parameters; (ii) Stokes polarimeter based on the method of four intensities; (iii) Stokes dynamic polarimeter. We...

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Дата:2009
Автори: Savenkov, S.N., Oberemok, Ye.A., Klimov, O.S., Barchuk, О.I.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2009
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/118872
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Effect of the structure of polarimeter characteristic matrix on light polarization measurements / S.N. Savenkov, Ye.A. Oberemok, O.S. Klimov, О.I. Barchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 3. — С.264-271. — Бібліогр.: 26 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1188722017-06-01T03:05:14Z Effect of the structure of polarimeter characteristic matrix on light polarization measurements Savenkov, S.N. Oberemok, Ye.A. Klimov, O.S. Barchuk, О.I. In the paper, we carried out the comparative analysis of three polarimeters among the most usable their variants: (i) Stokes polarimeter based on phenomenological definition of Stokes parameters; (ii) Stokes polarimeter based on the method of four intensities; (iii) Stokes dynamic polarimeter. We show that, since the accuracy in determination of individual Stokes parameter is different for different types of polarimeters, and, therewith, it depends on polarization of input light. All that strongly motivates the choice of type of polarimeter to provide minimum errors in determination of polarization parameters (ellipticity angle ε, azimuth β, and degree of polarization P). 2009 Article Effect of the structure of polarimeter characteristic matrix on light polarization measurements / S.N. Savenkov, Ye.A. Oberemok, O.S. Klimov, О.I. Barchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 3. — С.264-271. — Бібліогр.: 26 назв. — англ. 1560-8034 PACS 07.60.Fs http://dspace.nbuv.gov.ua/handle/123456789/118872 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description In the paper, we carried out the comparative analysis of three polarimeters among the most usable their variants: (i) Stokes polarimeter based on phenomenological definition of Stokes parameters; (ii) Stokes polarimeter based on the method of four intensities; (iii) Stokes dynamic polarimeter. We show that, since the accuracy in determination of individual Stokes parameter is different for different types of polarimeters, and, therewith, it depends on polarization of input light. All that strongly motivates the choice of type of polarimeter to provide minimum errors in determination of polarization parameters (ellipticity angle ε, azimuth β, and degree of polarization P).
format Article
author Savenkov, S.N.
Oberemok, Ye.A.
Klimov, O.S.
Barchuk, О.I.
spellingShingle Savenkov, S.N.
Oberemok, Ye.A.
Klimov, O.S.
Barchuk, О.I.
Effect of the structure of polarimeter characteristic matrix on light polarization measurements
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Savenkov, S.N.
Oberemok, Ye.A.
Klimov, O.S.
Barchuk, О.I.
author_sort Savenkov, S.N.
title Effect of the structure of polarimeter characteristic matrix on light polarization measurements
title_short Effect of the structure of polarimeter characteristic matrix on light polarization measurements
title_full Effect of the structure of polarimeter characteristic matrix on light polarization measurements
title_fullStr Effect of the structure of polarimeter characteristic matrix on light polarization measurements
title_full_unstemmed Effect of the structure of polarimeter characteristic matrix on light polarization measurements
title_sort effect of the structure of polarimeter characteristic matrix on light polarization measurements
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2009
url http://dspace.nbuv.gov.ua/handle/123456789/118872
citation_txt Effect of the structure of polarimeter characteristic matrix on light polarization measurements / S.N. Savenkov, Ye.A. Oberemok, O.S. Klimov, О.I. Barchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 3. — С.264-271. — Бібліогр.: 26 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT savenkovsn effectofthestructureofpolarimetercharacteristicmatrixonlightpolarizationmeasurements
AT oberemokyea effectofthestructureofpolarimetercharacteristicmatrixonlightpolarizationmeasurements
AT klimovos effectofthestructureofpolarimetercharacteristicmatrixonlightpolarizationmeasurements
AT barchukoi effectofthestructureofpolarimetercharacteristicmatrixonlightpolarizationmeasurements
first_indexed 2023-10-18T20:33:12Z
last_indexed 2023-10-18T20:33:12Z
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