Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure
The surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film system obtained by close-spaced vacuum sublimation technique under different grow conditions were investigated. Examination of surface profile and morphology was performed by scanning electron and optical microscopy....
Збережено в:
| Дата: | 2008 |
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| Автори: | , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2008
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/119059 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure / D. Kurbatov, A. Opanasyuk, V. Denisenko, A. Kramchenkov, M. Zaharets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 252-256. — Бібліогр.: 14 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-119059 |
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| record_format |
dspace |
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irk-123456789-1190592017-06-04T03:03:37Z Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure Kurbatov, D. Opanasyuk, A. Denisenko, V. Kramchenkov, A. Zaharets, M. The surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film system obtained by close-spaced vacuum sublimation technique under different grow conditions were investigated. Examination of surface profile and morphology was performed by scanning electron and optical microscopy. Chemical composition was studied by Rutherford back scattering method. Results of morphology studies enabled to determine dependence of the growth mechanism, roughness Ra, grain size D of ZnS layers on the growth conditions. The researches of chemical composition allowed to determine the concentration of compound elements and impurities, deviation from stoichiometry and thickness distribution of chemical elements. 2008 Article Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure / D. Kurbatov, A. Opanasyuk, V. Denisenko, A. Kramchenkov, M. Zaharets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 252-256. — Бібліогр.: 14 назв. — англ. 1560-8034 PACS 68.35.Ct, 68.55.J, 68.55.Nq http://dspace.nbuv.gov.ua/handle/123456789/119059 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
The surface morphology and chemical composition of Ag/ZnS/glassceramic
thin-film system obtained by close-spaced vacuum sublimation technique under different
grow conditions were investigated. Examination of surface profile and morphology was
performed by scanning electron and optical microscopy. Chemical composition was
studied by Rutherford back scattering method. Results of morphology studies enabled to
determine dependence of the growth mechanism, roughness Ra, grain size D of ZnS
layers on the growth conditions. The researches of chemical composition allowed to
determine the concentration of compound elements and impurities, deviation from
stoichiometry and thickness distribution of chemical elements. |
| format |
Article |
| author |
Kurbatov, D. Opanasyuk, A. Denisenko, V. Kramchenkov, A. Zaharets, M. |
| spellingShingle |
Kurbatov, D. Opanasyuk, A. Denisenko, V. Kramchenkov, A. Zaharets, M. Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Kurbatov, D. Opanasyuk, A. Denisenko, V. Kramchenkov, A. Zaharets, M. |
| author_sort |
Kurbatov, D. |
| title |
Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure |
| title_short |
Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure |
| title_full |
Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure |
| title_fullStr |
Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure |
| title_full_unstemmed |
Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure |
| title_sort |
investigations of surface morphology and chemical composition of ag/zns/glassceramic thin-film structure |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2008 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/119059 |
| citation_txt |
Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure / D. Kurbatov, A. Opanasyuk, V. Denisenko, A. Kramchenkov, M. Zaharets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 252-256. — Бібліогр.: 14 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
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| first_indexed |
2023-10-18T20:33:30Z |
| last_indexed |
2023-10-18T20:33:30Z |
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