Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure

The surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film system obtained by close-spaced vacuum sublimation technique under different grow conditions were investigated. Examination of surface profile and morphology was performed by scanning electron and optical microscopy....

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Видавець:Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Дата:2008
Автори: Kurbatov, D., Opanasyuk, A., Denisenko, V., Kramchenkov, A., Zaharets, M.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2008
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/119059
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Цитувати:Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure / D. Kurbatov, A. Opanasyuk, V. Denisenko, A. Kramchenkov, M. Zaharets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 252-256. — Бібліогр.: 14 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-119059
record_format dspace
spelling irk-123456789-1190592017-06-04T03:03:37Z Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure Kurbatov, D. Opanasyuk, A. Denisenko, V. Kramchenkov, A. Zaharets, M. The surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film system obtained by close-spaced vacuum sublimation technique under different grow conditions were investigated. Examination of surface profile and morphology was performed by scanning electron and optical microscopy. Chemical composition was studied by Rutherford back scattering method. Results of morphology studies enabled to determine dependence of the growth mechanism, roughness Ra, grain size D of ZnS layers on the growth conditions. The researches of chemical composition allowed to determine the concentration of compound elements and impurities, deviation from stoichiometry and thickness distribution of chemical elements. 2008 Article Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure / D. Kurbatov, A. Opanasyuk, V. Denisenko, A. Kramchenkov, M. Zaharets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 252-256. — Бібліогр.: 14 назв. — англ. 1560-8034 PACS 68.35.Ct, 68.55.J, 68.55.Nq http://dspace.nbuv.gov.ua/handle/123456789/119059 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description The surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film system obtained by close-spaced vacuum sublimation technique under different grow conditions were investigated. Examination of surface profile and morphology was performed by scanning electron and optical microscopy. Chemical composition was studied by Rutherford back scattering method. Results of morphology studies enabled to determine dependence of the growth mechanism, roughness Ra, grain size D of ZnS layers on the growth conditions. The researches of chemical composition allowed to determine the concentration of compound elements and impurities, deviation from stoichiometry and thickness distribution of chemical elements.
format Article
author Kurbatov, D.
Opanasyuk, A.
Denisenko, V.
Kramchenkov, A.
Zaharets, M.
spellingShingle Kurbatov, D.
Opanasyuk, A.
Denisenko, V.
Kramchenkov, A.
Zaharets, M.
Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Kurbatov, D.
Opanasyuk, A.
Denisenko, V.
Kramchenkov, A.
Zaharets, M.
author_sort Kurbatov, D.
title Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure
title_short Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure
title_full Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure
title_fullStr Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure
title_full_unstemmed Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure
title_sort investigations of surface morphology and chemical composition of ag/zns/glassceramic thin-film structure
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2008
url http://dspace.nbuv.gov.ua/handle/123456789/119059
citation_txt Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure / D. Kurbatov, A. Opanasyuk, V. Denisenko, A. Kramchenkov, M. Zaharets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 252-256. — Бібліогр.: 14 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
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first_indexed 2023-10-18T20:33:30Z
last_indexed 2023-10-18T20:33:30Z
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