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Spectral properties of reflective interference filters

The spectral properties of band reflective interference filters are investigated. The operation of the filter is based on the method of residual rays. Angular dependences of the filter transmission bandshape on the parameters of multilayer coating, such as the thickness, refractive indexes, the numb...

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Main Authors: Pervak, V.Yu., Poperenko, L.V., Pervak, Yu.A.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2001
Series:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/119259
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spelling irk-123456789-1192592017-06-06T03:04:08Z Spectral properties of reflective interference filters Pervak, V.Yu. Poperenko, L.V. Pervak, Yu.A. The spectral properties of band reflective interference filters are investigated. The operation of the filter is based on the method of residual rays. Angular dependences of the filter transmission bandshape on the parameters of multilayer coating, such as the thickness, refractive indexes, the number of the layers, are analyzed. 2001 Article Spectral properties of reflective interference filters / V.Yu. Pervak, L.V. Poperenko, Yu.A. Pervak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 2. — С. 134-138. — Бібліогр.: 8 назв. — англ. 1560-8034 PACS: 42.25.B, 77.84.B, 78.20.C http://dspace.nbuv.gov.ua/handle/123456789/119259 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description The spectral properties of band reflective interference filters are investigated. The operation of the filter is based on the method of residual rays. Angular dependences of the filter transmission bandshape on the parameters of multilayer coating, such as the thickness, refractive indexes, the number of the layers, are analyzed.
format Article
author Pervak, V.Yu.
Poperenko, L.V.
Pervak, Yu.A.
spellingShingle Pervak, V.Yu.
Poperenko, L.V.
Pervak, Yu.A.
Spectral properties of reflective interference filters
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Pervak, V.Yu.
Poperenko, L.V.
Pervak, Yu.A.
author_sort Pervak, V.Yu.
title Spectral properties of reflective interference filters
title_short Spectral properties of reflective interference filters
title_full Spectral properties of reflective interference filters
title_fullStr Spectral properties of reflective interference filters
title_full_unstemmed Spectral properties of reflective interference filters
title_sort spectral properties of reflective interference filters
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2001
url http://dspace.nbuv.gov.ua/handle/123456789/119259
citation_txt Spectral properties of reflective interference filters / V.Yu. Pervak, L.V. Poperenko, Yu.A. Pervak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 2. — С. 134-138. — Бібліогр.: 8 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT pervakvyu spectralpropertiesofreflectiveinterferencefilters
AT poperenkolv spectralpropertiesofreflectiveinterferencefilters
AT pervakyua spectralpropertiesofreflectiveinterferencefilters
first_indexed 2023-10-18T20:34:08Z
last_indexed 2023-10-18T20:34:08Z
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