The impact of laser shock waves on anodic oxide - compound semiconductor interface
The present work shows that the induced positive charge value at the anodic oxide -HgCdTe (AO-MCT) interface reaches its constant value (6.0±1.0)•10¹¹ cm⁻² under laser shock wave (LSW) treatment. We demonstrate that this treatment decreases electron concentration in a converted n-type layer by one o...
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Дата: | 2001 |
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Автори: | , , |
Формат: | Стаття |
Мова: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2001
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Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/119323 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | The impact of laser shock waves on anodic oxide - compound semiconductor interface / V.S. Yakovyna, N.N. Berchenko, Yu.N. Nikiforov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 283-286. — Бібліогр.: 12 назв. — англ. |
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irk-123456789-1193232017-06-07T03:04:34Z The impact of laser shock waves on anodic oxide - compound semiconductor interface Yakovyna, V.S. Berchenko, N.N. Nikiforov, Yu.N. The present work shows that the induced positive charge value at the anodic oxide -HgCdTe (AO-MCT) interface reaches its constant value (6.0±1.0)•10¹¹ cm⁻² under laser shock wave (LSW) treatment. We demonstrate that this treatment decreases electron concentration in a converted n-type layer by one order of magnitude in annealed AO-MCT based structures, and the annealing time needed to have this layer disappeared decreases as well. The model of LSW impact on the AO-MCT interface is analysed. Remove selected 2001 Article The impact of laser shock waves on anodic oxide - compound semiconductor interface / V.S. Yakovyna, N.N. Berchenko, Yu.N. Nikiforov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 283-286. — Бібліогр.: 12 назв. — англ. 1560-8034 PACS: 62.50.+p, 68.35.Dv http://dspace.nbuv.gov.ua/handle/123456789/119323 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine |
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DSpace DC |
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English |
description |
The present work shows that the induced positive charge value at the anodic oxide -HgCdTe (AO-MCT) interface reaches its constant value (6.0±1.0)•10¹¹ cm⁻² under laser shock wave (LSW) treatment. We demonstrate that this treatment decreases electron concentration in a converted n-type layer by one order of magnitude in annealed AO-MCT based structures, and the annealing time needed to have this layer disappeared decreases as well. The model of LSW impact on the AO-MCT interface is analysed.
Remove selected |
format |
Article |
author |
Yakovyna, V.S. Berchenko, N.N. Nikiforov, Yu.N. |
spellingShingle |
Yakovyna, V.S. Berchenko, N.N. Nikiforov, Yu.N. The impact of laser shock waves on anodic oxide - compound semiconductor interface Semiconductor Physics Quantum Electronics & Optoelectronics |
author_facet |
Yakovyna, V.S. Berchenko, N.N. Nikiforov, Yu.N. |
author_sort |
Yakovyna, V.S. |
title |
The impact of laser shock waves on anodic oxide - compound semiconductor interface |
title_short |
The impact of laser shock waves on anodic oxide - compound semiconductor interface |
title_full |
The impact of laser shock waves on anodic oxide - compound semiconductor interface |
title_fullStr |
The impact of laser shock waves on anodic oxide - compound semiconductor interface |
title_full_unstemmed |
The impact of laser shock waves on anodic oxide - compound semiconductor interface |
title_sort |
impact of laser shock waves on anodic oxide - compound semiconductor interface |
publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
publishDate |
2001 |
url |
http://dspace.nbuv.gov.ua/handle/123456789/119323 |
citation_txt |
The impact of laser shock waves on anodic oxide - compound semiconductor interface / V.S. Yakovyna, N.N. Berchenko, Yu.N. Nikiforov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 283-286. — Бібліогр.: 12 назв. — англ. |
series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
work_keys_str_mv |
AT yakovynavs theimpactoflasershockwavesonanodicoxidecompoundsemiconductorinterface AT berchenkonn theimpactoflasershockwavesonanodicoxidecompoundsemiconductorinterface AT nikiforovyun theimpactoflasershockwavesonanodicoxidecompoundsemiconductorinterface AT yakovynavs impactoflasershockwavesonanodicoxidecompoundsemiconductorinterface AT berchenkonn impactoflasershockwavesonanodicoxidecompoundsemiconductorinterface AT nikiforovyun impactoflasershockwavesonanodicoxidecompoundsemiconductorinterface |
first_indexed |
2023-10-18T20:34:17Z |
last_indexed |
2023-10-18T20:34:17Z |
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