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Thickness dependences of optical constants for thin layers of some metals and semiconductors
The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors. It has been shown that erroneous results were obtained in many papers and correct interpretation of the latter is...
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| Language: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2001
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| Series: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/119328 |
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irk-123456789-1193282017-06-07T03:04:15Z Thickness dependences of optical constants for thin layers of some metals and semiconductors Kovalenko, S.A. Lisitsa, M.P. The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors. It has been shown that erroneous results were obtained in many papers and correct interpretation of the latter is absent. The reason that braked the solution of the problem of dimensional optical phenomena in thin layer physics was ascertained. 2001 Article Thickness dependences of optical constants for thin layers of some metals and semiconductors / S.A. Kovalenko, M.P. Lisitsa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 352-357. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS: 78.66 http://dspace.nbuv.gov.ua/handle/123456789/119328 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine |
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English |
| description |
The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors.
It has been shown that erroneous results were obtained in many papers and correct interpretation of the latter is absent. The reason that braked the solution of the problem of dimensional optical phenomena in thin layer physics was ascertained. |
| format |
Article |
| author |
Kovalenko, S.A. Lisitsa, M.P. |
| spellingShingle |
Kovalenko, S.A. Lisitsa, M.P. Thickness dependences of optical constants for thin layers of some metals and semiconductors Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Kovalenko, S.A. Lisitsa, M.P. |
| author_sort |
Kovalenko, S.A. |
| title |
Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_short |
Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_full |
Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_fullStr |
Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_full_unstemmed |
Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_sort |
thickness dependences of optical constants for thin layers of some metals and semiconductors |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2001 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/119328 |
| citation_txt |
Thickness dependences of optical constants for thin layers of some metals and semiconductors / S.A. Kovalenko, M.P. Lisitsa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 352-357. — Бібліогр.: 13 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| work_keys_str_mv |
AT kovalenkosa thicknessdependencesofopticalconstantsforthinlayersofsomemetalsandsemiconductors AT lisitsamp thicknessdependencesofopticalconstantsforthinlayersofsomemetalsandsemiconductors |
| first_indexed |
2023-10-18T20:34:18Z |
| last_indexed |
2023-10-18T20:34:18Z |
| _version_ |
1796150548723924992 |