2025-02-23T07:03:53-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22irk-123456789-119328%22&qt=morelikethis&rows=5
2025-02-23T07:03:53-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22irk-123456789-119328%22&qt=morelikethis&rows=5
2025-02-23T07:03:53-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-23T07:03:53-05:00 DEBUG: Deserialized SOLR response
Thickness dependences of optical constants for thin layers of some metals and semiconductors

Thickness dependences of optical constants for thin layers of some metals and semiconductors

The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors. It has been shown that erroneous results were obtained in many papers and correct interpretation of the latter is...

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Bibliographic Details
Main Authors: Kovalenko, S.A., Lisitsa, M.P.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2001
Series:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/119328
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2025-02-23T07:03:53-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&rows=40&rows=5&wt=json&json.nl=arrarr&q=id%3A%22irk-123456789-119328%22&qt=morelikethis
2025-02-23T07:03:53-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&rows=40&rows=5&wt=json&json.nl=arrarr&q=id%3A%22irk-123456789-119328%22&qt=morelikethis
2025-02-23T07:03:53-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-23T07:03:53-05:00 DEBUG: Deserialized SOLR response

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