Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions

We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vo...

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Дата:2004
Автори: Ivanov, Z.G., Fogel, N.Ya., Yuzephovich, O.I., Stepantsov, E.A., Tzalenchuk, A.Ya.
Формат: Стаття
Мова:English
Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2004
Назва видання:Физика низких температур
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Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/119474
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Цитувати:Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-119474
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spelling irk-123456789-1194742017-06-08T03:06:06Z Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions Ivanov, Z.G. Fogel, N.Ya. Yuzephovich, O.I. Stepantsov, E.A. Tzalenchuk, A.Ya. Свеpхпpоводимость, в том числе высокотемпеpатуpная We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S–S–S nature of the small-angle grain boundary junction. 2004 Article Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ. 0132-6414 PACS: 74.60.Jg, 74.60.Ec, 74.72.Bk http://dspace.nbuv.gov.ua/handle/123456789/119474 en Физика низких температур Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
topic Свеpхпpоводимость, в том числе высокотемпеpатуpная
Свеpхпpоводимость, в том числе высокотемпеpатуpная
spellingShingle Свеpхпpоводимость, в том числе высокотемпеpатуpная
Свеpхпpоводимость, в том числе высокотемпеpатуpная
Ivanov, Z.G.
Fogel, N.Ya.
Yuzephovich, O.I.
Stepantsov, E.A.
Tzalenchuk, A.Ya.
Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
Физика низких температур
description We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S–S–S nature of the small-angle grain boundary junction.
format Article
author Ivanov, Z.G.
Fogel, N.Ya.
Yuzephovich, O.I.
Stepantsov, E.A.
Tzalenchuk, A.Ya.
author_facet Ivanov, Z.G.
Fogel, N.Ya.
Yuzephovich, O.I.
Stepantsov, E.A.
Tzalenchuk, A.Ya.
author_sort Ivanov, Z.G.
title Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
title_short Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
title_full Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
title_fullStr Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
title_full_unstemmed Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
title_sort depairing critical currents and self-magnetic field effects in submicron yba₂cu₃o₇₋δ microbridges and bicrystal junctions
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
publishDate 2004
topic_facet Свеpхпpоводимость, в том числе высокотемпеpатуpная
url http://dspace.nbuv.gov.ua/handle/123456789/119474
citation_txt Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ.
series Физика низких температур
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first_indexed 2023-10-18T20:34:38Z
last_indexed 2023-10-18T20:34:38Z
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