Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vo...
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Дата: | 2004 |
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Автори: | , , , , |
Формат: | Стаття |
Мова: | English |
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Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2004
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Назва видання: | Физика низких температур |
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Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/119474 |
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Цитувати: | Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ. |
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irk-123456789-1194742017-06-08T03:06:06Z Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions Ivanov, Z.G. Fogel, N.Ya. Yuzephovich, O.I. Stepantsov, E.A. Tzalenchuk, A.Ya. Свеpхпpоводимость, в том числе высокотемпеpатуpная We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S–S–S nature of the small-angle grain boundary junction. 2004 Article Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ. 0132-6414 PACS: 74.60.Jg, 74.60.Ec, 74.72.Bk http://dspace.nbuv.gov.ua/handle/123456789/119474 en Физика низких температур Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
collection |
DSpace DC |
language |
English |
topic |
Свеpхпpоводимость, в том числе высокотемпеpатуpная Свеpхпpоводимость, в том числе высокотемпеpатуpная |
spellingShingle |
Свеpхпpоводимость, в том числе высокотемпеpатуpная Свеpхпpоводимость, в том числе высокотемпеpатуpная Ivanov, Z.G. Fogel, N.Ya. Yuzephovich, O.I. Stepantsov, E.A. Tzalenchuk, A.Ya. Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions Физика низких температур |
description |
We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle
bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by
a transport current and their influence on the I–V curves. The interplay between the depairing and
the vortex motion determines a crossover in the temperature dependence of the critical current.
The high entrance field of vortices in very narrow superconducting channels creates the possibility
of carrying a critical current close to the depairing limit determined by the S–S–S nature of the
small-angle grain boundary junction. |
format |
Article |
author |
Ivanov, Z.G. Fogel, N.Ya. Yuzephovich, O.I. Stepantsov, E.A. Tzalenchuk, A.Ya. |
author_facet |
Ivanov, Z.G. Fogel, N.Ya. Yuzephovich, O.I. Stepantsov, E.A. Tzalenchuk, A.Ya. |
author_sort |
Ivanov, Z.G. |
title |
Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions |
title_short |
Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions |
title_full |
Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions |
title_fullStr |
Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions |
title_full_unstemmed |
Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions |
title_sort |
depairing critical currents and self-magnetic field effects in submicron yba₂cu₃o₇₋δ microbridges and bicrystal junctions |
publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
publishDate |
2004 |
topic_facet |
Свеpхпpоводимость, в том числе высокотемпеpатуpная |
url |
http://dspace.nbuv.gov.ua/handle/123456789/119474 |
citation_txt |
Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ. |
series |
Физика низких температур |
work_keys_str_mv |
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first_indexed |
2023-10-18T20:34:38Z |
last_indexed |
2023-10-18T20:34:38Z |
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