Perspectives of development of X-ray analysis for material composition
Perspectives are considered for increasing the sensitivity of X-ray analysis and broadening the range of measurements toward chemical elements with small atomic numbers up to hydrogen at the expense of formation of the optimized selective spectrum from a preliminary beam for exciting fluorescence an...
Збережено в:
| Дата: | 2016 |
|---|---|
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
НТК «Інститут монокристалів» НАН України
2016
|
| Назва видання: | Functional Materials |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/119712 |
| Теги: |
Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Perspectives of development of X-ray analysis for material composition / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, L.P. Fomina // Functional Materials. — 2016. — Т. 23, № 1. — С. 5-14. — Бібліогр.: 14 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-119712 |
|---|---|
| record_format |
dspace |
| spelling |
irk-123456789-1197122017-06-09T03:04:00Z Perspectives of development of X-ray analysis for material composition Mikhailov, I.F. Baturin, A.A. Mikhailov, A.I. Fomina, L.P. Characterization and properties Perspectives are considered for increasing the sensitivity of X-ray analysis and broadening the range of measurements toward chemical elements with small atomic numbers up to hydrogen at the expense of formation of the optimized selective spectrum from a preliminary beam for exciting fluorescence and observing scattering peaks and diffraction reflections. It has been shown that low-power preliminary sources (X-ray tube, 20 W) are able to provide the detection limit for trace impurities near 0.1 ppm, and for hydrogen in metals - up to 10 ppm. The data presented are hopeful for attaining X-ray analysis sensitivity at the level of ppb units due to application of powerful preliminary beams (synchrotron, undulators, wigglers, etc.). 2016 Article Perspectives of development of X-ray analysis for material composition / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, L.P. Fomina // Functional Materials. — 2016. — Т. 23, № 1. — С. 5-14. — Бібліогр.: 14 назв. — англ. 1027-5495 DOI: dx.doi.org/10.15407/fm23.01.005 http://dspace.nbuv.gov.ua/handle/123456789/119712 en Functional Materials НТК «Інститут монокристалів» НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| topic |
Characterization and properties Characterization and properties |
| spellingShingle |
Characterization and properties Characterization and properties Mikhailov, I.F. Baturin, A.A. Mikhailov, A.I. Fomina, L.P. Perspectives of development of X-ray analysis for material composition Functional Materials |
| description |
Perspectives are considered for increasing the sensitivity of X-ray analysis and broadening the range of measurements toward chemical elements with small atomic numbers up to hydrogen at the expense of formation of the optimized selective spectrum from a preliminary beam for exciting fluorescence and observing scattering peaks and diffraction reflections. It has been shown that low-power preliminary sources (X-ray tube, 20 W) are able to provide the detection limit for trace impurities near 0.1 ppm, and for hydrogen in metals - up to 10 ppm. The data presented are hopeful for attaining X-ray analysis sensitivity at the level of ppb units due to application of powerful preliminary beams (synchrotron, undulators, wigglers, etc.). |
| format |
Article |
| author |
Mikhailov, I.F. Baturin, A.A. Mikhailov, A.I. Fomina, L.P. |
| author_facet |
Mikhailov, I.F. Baturin, A.A. Mikhailov, A.I. Fomina, L.P. |
| author_sort |
Mikhailov, I.F. |
| title |
Perspectives of development of X-ray analysis for material composition |
| title_short |
Perspectives of development of X-ray analysis for material composition |
| title_full |
Perspectives of development of X-ray analysis for material composition |
| title_fullStr |
Perspectives of development of X-ray analysis for material composition |
| title_full_unstemmed |
Perspectives of development of X-ray analysis for material composition |
| title_sort |
perspectives of development of x-ray analysis for material composition |
| publisher |
НТК «Інститут монокристалів» НАН України |
| publishDate |
2016 |
| topic_facet |
Characterization and properties |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/119712 |
| citation_txt |
Perspectives of development of X-ray analysis for material composition / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, L.P. Fomina // Functional Materials. — 2016. — Т. 23, № 1. — С. 5-14. — Бібліогр.: 14 назв. — англ. |
| series |
Functional Materials |
| work_keys_str_mv |
AT mikhailovif perspectivesofdevelopmentofxrayanalysisformaterialcomposition AT baturinaa perspectivesofdevelopmentofxrayanalysisformaterialcomposition AT mikhailovai perspectivesofdevelopmentofxrayanalysisformaterialcomposition AT fominalp perspectivesofdevelopmentofxrayanalysisformaterialcomposition |
| first_indexed |
2023-10-18T20:35:17Z |
| last_indexed |
2023-10-18T20:35:17Z |
| _version_ |
1796150589444325376 |