High-stable standard samples of mass in the nano-gram range
High-stable mass standards prepared as magnetron sputtered super-smooth metal layers deposited on single crystal substrates were attested. The thin film standards were found to meet the requirements to government standards: they are homogeneous, long-lived, and can be attested by several independent...
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| Дата: | 2013 |
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| Автори: | , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
НТК «Інститут монокристалів» НАН України
2013
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| Назва видання: | Functional Materials |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/120075 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | High-stable standard samples of mass in the nano-gram range / I.F. Mikhailov, A.A. Baturin, Ye.A. Bugaev, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2013. — Т. 20, № 2. — С. 266-271. — Бібліогр.: 9 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-120075 |
|---|---|
| record_format |
dspace |
| spelling |
irk-123456789-1200752017-06-12T03:03:18Z High-stable standard samples of mass in the nano-gram range Mikhailov, I.F. Baturin, A.A. Bugaev, Ye.A. Mikhailov, A.I. Borisova, S.S. Devices and instruments High-stable mass standards prepared as magnetron sputtered super-smooth metal layers deposited on single crystal substrates were attested. The thin film standards were found to meet the requirements to government standards: they are homogeneous, long-lived, and can be attested by several independent methods. Using the standards, the measurement accuracy is provided not worse than 1 ng in the range from 1 to 17 ng, and not worse than 8 ng in the range from 17 to 3800 ng. 2013 Article High-stable standard samples of mass in the nano-gram range / I.F. Mikhailov, A.A. Baturin, Ye.A. Bugaev, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2013. — Т. 20, № 2. — С. 266-271. — Бібліогр.: 9 назв. — англ. 1027-5495 DOI: dx.doi.org/10.15407/fm20.02.266 http://dspace.nbuv.gov.ua/handle/123456789/120075 en Functional Materials НТК «Інститут монокристалів» НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| topic |
Devices and instruments Devices and instruments |
| spellingShingle |
Devices and instruments Devices and instruments Mikhailov, I.F. Baturin, A.A. Bugaev, Ye.A. Mikhailov, A.I. Borisova, S.S. High-stable standard samples of mass in the nano-gram range Functional Materials |
| description |
High-stable mass standards prepared as magnetron sputtered super-smooth metal layers deposited on single crystal substrates were attested. The thin film standards were found to meet the requirements to government standards: they are homogeneous, long-lived, and can be attested by several independent methods. Using the standards, the measurement accuracy is provided not worse than 1 ng in the range from 1 to 17 ng, and not worse than 8 ng in the range from 17 to 3800 ng. |
| format |
Article |
| author |
Mikhailov, I.F. Baturin, A.A. Bugaev, Ye.A. Mikhailov, A.I. Borisova, S.S. |
| author_facet |
Mikhailov, I.F. Baturin, A.A. Bugaev, Ye.A. Mikhailov, A.I. Borisova, S.S. |
| author_sort |
Mikhailov, I.F. |
| title |
High-stable standard samples of mass in the nano-gram range |
| title_short |
High-stable standard samples of mass in the nano-gram range |
| title_full |
High-stable standard samples of mass in the nano-gram range |
| title_fullStr |
High-stable standard samples of mass in the nano-gram range |
| title_full_unstemmed |
High-stable standard samples of mass in the nano-gram range |
| title_sort |
high-stable standard samples of mass in the nano-gram range |
| publisher |
НТК «Інститут монокристалів» НАН України |
| publishDate |
2013 |
| topic_facet |
Devices and instruments |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/120075 |
| citation_txt |
High-stable standard samples of mass in the nano-gram range / I.F. Mikhailov, A.A. Baturin, Ye.A. Bugaev, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2013. — Т. 20, № 2. — С. 266-271. — Бібліогр.: 9 назв. — англ. |
| series |
Functional Materials |
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| first_indexed |
2023-10-18T20:36:09Z |
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